X-rite Europe Gmbh

Esko Software Bvba

Moshe Keydar

Francis Lamy

Martin Beyer

Baldewin Meireson

A method of spectrally characterising an ink printed over another ink, and of calculating a spectral measure of reflectance of an overprint of a plurality of inks thus characterized. The method uses spectral measurements of a substrate. For an order of printing an overprint, for each ink, for a respective amount of printing of the ink, the method accepts or determines a respective interaction of absorption and reflection function ('IAR function') indicative of how the ink interacts with a printed background and includes determining the spectral reflectance by repeatedly multiplying, in the order, for each additional ink added to a current background the spectral measure of the current background by exponentiation of the ratio of the spectral measure of the additional ink on the substrate to the spectral measure of the substrate, by the TAR function of the additional ink.

Calculating the spectral characteristics of the color resulting from overlaying colorants

Exemplary methods are directed to the linearization and characterization of an image producing device. In the method, a color test chart of the device is reproduced and measured based on a small number of color measurement fields with defined device color values. Associated color values are determined for each color measurement field and used to calculate linearization curves for the device. Additionally, by analysis of the device color values, the measured color values, and device behavior, an expanded color test chart with expanded device color values and associated expanded color values is calculated. The number of color measurement fields in the expanded color test chart is larger than the number of color measurement fields in the original color test chart. An ICC profile for the device is calculated from the expanded device color values and the expanded color values.

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Holon, Israel

Moshe Keydar