Jordan Valley Semiconductors Ltd.

Moshe Beylin

Isaac Mazor

Boris Yokhin

David Berman

Alex Dikopoltsev

Dileep Kumar Agnihotri

Alex Tokar

Tzachi Rafaeli

The computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective location. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected location.

Automated selection of X-ray reflectometry measurement locations

Growing community of inventors

Nahariya, Israel

Moshe Beylin