Intel Corporation

Other

Ispray, LLC

Morten S Jensen

Joe F Walczyk

Nader N Abazarnia

Christopher Roy Schroeder

James R Hastings

Michael C Ryan

John C Johnson

Srikant Nekkanty

Paul J Diglio

Todd R Coons

Christopher Wade Ackerman

Akhilesh P Rallabandi

Rene J Sanchez

David Won-jun Song

John P O'Reilly

Richard L Mauro

Kent H Jones

Rene L Campbell

Scott D McPherson

Ben Dameron

Dean D Rau

Raphael D McAbee-Reher

An interconnect that has an electrically conductive layer, where a first and second insulator layers are coupled with the conductive layer. A region of the conductive layer includes an opening of a portion of the first insulator layer the second insulator layer that are adjacent to the region. An electrical connector of a first device is electrically coupled to a portion of the region on a first side of the conductive layer and an electrical conductor of a second device is electrically coupled with a portion of the region on the second side. Also, an interconnect coupled with a substrate that includes a cylinder extending from a side of the substrate with a plate coupled at the end of the cylinder with an opening that includes two or more tabs of the plate extending into the opening to receive a connector.

Electrical connector with insulated conductive layer

An apparatus for testing integrated circuits (ICs) , includes a first thermal contact structure having a first surface to interface with a heat source and an opposing second surface to interface with a device under test (DUT). A second thermal contact structure is above the first thermal contact structure and separated therefrom by a variable-resistance thermal interface (VRTI) structure operable to couple or decouple the first and second thermal contact structures from one another. The VRTI structure has a maximal thermal conductivity associated with a first state, and a minimal thermal conductivity associated with a second state.

Thermal switch for rapid thermal coupling and decoupling of devices under test

Techniques for thermal management of a device under test are discussed. In an example, an apparatus may include a pedestal having a device-specific surface configured to exchange heat with the integrated circuit while the device-specific surface is in contact with a surface of the integrated circuit or separated from the surface of the integrated circuit by a layer of thermally conductive material, and a heat generating element configured to heat the device-specific surface. In certain examples, the pedestal may include a plurality of channels configured to couple to a manifold and to route thermal material from the manifold through an interior of the pedestal for maintaining temperature control of the surface of an integrated circuit under test.

System for thermal management of device under test (DUT)

Placing integrated circuit devices using a perturbation is described. In one example, a testing platform has a circuit board. A socket is on the board for receiving and connecting to an integrated circuit package. The socket has an array of pins to engage connection bumps on a surface of the package and a biasing feature to guide the package into alignment with the pins of the socket. A perturbation source induces movement of the package into alignment with the pins of the socket.

Placing integrated circuit devices using perturbation

Canister

A system tracks ownership data for data resources coupled on a network. The system includes a data extractor for extracting data resource communication activity data from a plurality of network activity data sources, a database of organizational data resource ownership data, and a communication activity report generator for correlating extracted data resource communication activity data and organizational data resource ownership data so that ownership of communication activity may be tracked. The data extractor obtains network activity data from a variety of data sources such as firewalls, routers, servers, and PBXs. Network activity data about communication activity may be obtained directly from the data resources initiating the communication activity or from data sources that handle communication activity initiated by a data resource. The network activity data are then processed to extract data resource communication activity data. Organizational data resource ownership data includes data for identifying the data resources from which communication activity data are extracted and the organizational entities owning the data resources. Typically, these organizational entities include company data, division data, department data, and owner data. This data may then be linked to identify an owner as being associated with a particular department and division within a company. The communication activity report generator may be used to generate a response to a directory query or a history query. A response to a directory query identifies one or more data resources and the ownership data linked to that device. A response to a history query identifies for a particular time period, one or more data resources, the network activity initiated by those data resources and ownership data linked to those data resources.

System and method for managing computer and phone network resources

Growing community of inventors

Mesa, AZ, United States of America

Morten S Jensen