Sharp Kabushiki Kaisha Corporation

Morihide Ohsaki

Toshihide Tsubata

Masanori Takeuchi

Yoshinori Shimada

Tsuyoshi Tokuda

Yasuhiro Kohara

Kenji Takii

Toshihide Morimoto

Nobuaki Kakimori

Shin Kishimoto

Yuho Takahashi

Toru Shirai

The display device substrate according to the present invention is arranged so that: a source line is provided on an area on which a pixel electrode is not provided, and a gap is provided between the source line and the pixel electrode, and a black matrix (light shielding film) which covers a surface of the source line overlaps with the pixel electrode. Thus, it is possible to prevent parasitic capacitance (Csd) between the pixel electrode and the source line from becoming uneven in a display area, so that it is possible to reduce display unevenness of a liquid crystal display device using the present display device substrate.

Display device substrate and liquid crystal display device having the same

A method for inspecting a color filter includes a first step of disposing the color filter so that the color filter is opposed to a light source, a second step of outputting, from the light source, monochromatic light of a color corresponding to one of the colors of color layers of the color filter and entering the light into the plurality of color layers, and a third step of inspecting for display unevenness in each of the color layers with light transmitted through the color layers.

Method and apparatus for inspecting color filter

A color filter substrate includes a transparent substrate with first and second opposed edges, a color filter layer including color filters of first, second and third types extending in a first direction with the third type interposed between the first and second types, and an opaque layer including opaque portions extending in the first direction and another opaque portion connected to the other opaque portions along the second edge. The color filter substrate is fabricated by (a) forming the opaque layer on the transparent substrate, and then (b) forming the color filter layer thereon. The step (a) includes forming an opening in a non-effective display area of the color filter substrate between one end of each color filter of the third type and the second edge. The step (b) includes attaching and rolling a dry film in the first direction on the transparent substrate after the color filters of the first and second types have been provided thereon.

Color filter substrate having dummy color filter in non-effective display area, and display device including the same

To determine whether chip components are properly mounted on a printed circuit board, two sets of slit light beams for projecting slit line images in mutually perpendicular directions are alternately made incident thereon diagonally from above. Edges of the mounted chip components produce discontinuities in the projected slit beam image patterns such that the positions, sizes, orientations, etc. of individual mounted components can be calculated from image data obtained from viewing positions above the circuit board by a camera or the like. Since it can be easily ascertained how the slit line image pattern should appear if proper components are properly mounted, an analysis of the calculated data can indicate whether the chip components are properly mounted on the tested printed circuit board.

Method of and apparatus for inspecting mounting of chip components

Growing community of inventors

Tsu, Japan

Morihide Ohsaki