Advanced Inquiry Systems, Inc.

Translarity, Inc.

Other

Morgan/weiss Technologies Inc.

Octavian Scientific, Inc.

Efficere, Inc.

Morgan Connector

Morgan Miller Technologies LLC

Morgan Labs, LLC

Prototype Solutions Corporation

Morgan T Johnson

Aaron Durbin

Frederick George Weiss

David Keith

Jose A Santos

Raymond J Werner

William A Miller

Douglas A Preston

Peter H Decher

David R Ekstrom

Lawrence H Walls

A computing device has a motherboard circuit substrate having at least a first layer of electrical interconnects, a socket arranged to receive a main processor for the computing device, the socket electrically coupled to at least a portion of the first layer of electrical interconnects, at least two interposer substrates between the main processor and the socket such that the interposer substrate electrically connects to the main processor and the socket, wherein the interposer substrate has a first set of interconnects that electrically connect between the socket and the first layer of electrical interconnects, at least two peripheral circuits on each interposer substrate, the peripheral circuit connected to the main processor through a second set of interconnects on the interposer substrate that connects to the main processor without connecting to the socket or the motherboard circuit substrate, wherein each interposer substrate is folded to allow each peripheral circuit to have an equal path length between the peripheral circuit and the main processor, wherein the at least two interposer substrates are stacked such that the at least two peripheral circuits on each interposer substrate are stacked with the at least two peripheral circuits on another of the at least two interposer substrates.

Stacked and folded above motherboard interposer

A wafer testing system and associated methods of use and manufacture are disclosed herein. In one embodiment, the wafer test system includes an interposer having a first surface and a second surface facing away from the first surface. The system also includes a wafer translator having a first side facing the second surface of the interposer and a second side facing away from the first side and toward a wafer, the first side carrying a plurality of first terminals at a first scale and the second side carrying a plurality of second terminals at a second scale. The first scale is greater than the second scale.

Wafer testing system and associated methods of use and manufacture

An apparatus includes a processor having an array of processor interconnects arranged to connect the processor to conductive paths, a circuit substrate having an array of circuit interconnects arranged to provide connections between the processor and the circuit substrate, the circuit substrate having conductive paths connected to the array of circuit interconnects, an interposer substrate arranged between the processor and the circuit substrate, at least one conductive trace in the interposer substrate in connection with at least one processor interconnect in the array of interconnects on the processor, the conductive trace arranged at least partially parallel to the interposer substrate such that no electrical connection exists between the conductive trace in the interposer substrate and a corresponding one of the circuit interconnects on the circuit substrate, and at least one peripheral circuit connected to the at least one conductive trace.

Interposer with high bandwidth connections between a central processor and memory

Nanospike contactors suitable for semiconductor device test, and associated systems and methods are disclosed. A representative apparatus includes a package having a wafer side positioned to face toward a device under test and an inquiry side facing away from the wafer side. A plurality of wafer side sites are carried at the wafer side of the package. The nanospikes can be attached to nanospike sites on a wafer side of the package. Because of their small size, multiple nanospikes make contact with a single pad/solderball on the semiconductor device. In some embodiments, after detecting that the device under test passes the test, the device under the test can be packaged to create a known good die in a package.

Designed asperity contactors, including nanospikes, for semiconductor test using a package, and associated systems and methods

Methods and apparatus for testing unsingulated integrated circuits on a wafer include adapting a wafer prober for use with full-wafer-contacter disposed on the wafer. Some embodiments include placing wafer on a chuck of the prober, aligning the wafer to a full-wafer contacter incorporated in the wafer prober; removably attaching the wafer to the full wafer contacter, separating the wafer from the chuck, and making electrical contact to one or more integrated circuits of the wafer by making physical contact with a surface of the full-wafer contacter that faces away from the wafer.

Wafer prober integrated with full-wafer contacter

A wafer testing system and associated methods of use and manufacture are disclosed herein. In one embodiment, the wafer testing system includes an assembly for releaseably attaching a wafer to a wafer translator and the wafer translator to an interposer by means of separately operable vacuums, or pressure differentials. The assembly includes a wafer translator support ring coupled to the wafer translator, wherein a first flexible material extends from the wafer translator support ring so as to enclose the space between the wafer translator and the interposer so that the space may be evacuated by a first vacuum through one or more first evacuation paths. The assembly can further include a wafer support ring coupled to the wafer and the chuck, wherein a second flexible material extends from wafer support ring so as to enclose the space between the wafer and the wafer translator so that the space may be evacuated by a second vacuum through one or more second evacuation pathways.

Assemblies include a substrate, such as a printed circuit board, with a first array of contact pads disposed thereon; a guide ring structure disposed on the substrate and at least partially surrounding the first array of contact pads; a translator socket disposed on the first array of contact pads, the translator socket adapted to receive the tester side of a translated wafer; a thermally conductive, conformal, heat spreading cushion adapted to be disposed over the backside of a wafer; a cover plate adapted to fit over the first array of contact pads, align with the guide ring structure, contain within it the various components disposed over the first array of contact pads, and removably attach to the substrate; and a bolster plate adapted to removably attach to a second side of the substrate. In a further aspect a translated wafer is disposed over the translator socket such that the tester side of the translator is in contact with the translator socket; and the heat spreading cushion is disposed over the backside of the translated wafer. In a still further aspect, the substrate includes signal communication means, such as but not limited to, an edge connector adapted to couple to various controller circuits, which are typically disposed on a printed circuit board.

Full-water test and burn-in mechanism

A multi-layer interposer substrate includes multiple layers of single interposer substrates. Each single interposer substrate has a first array of interposer interconnects, each interposer interconnect in the first array of interposer interconnects corresponding to interconnects in an array of processor interconnects, a second array of interposer interconnects, each interposer interconnect in the second array of the interposer interconnects corresponding to an array of circuit interconnects on a circuit substrate, and at least one conductive trace in the interposer substrate in connection with at least one interconnect in the first array of interposer interconnects. The conductive trace has a parallel portion parallel to the interposer substrate such that no electrical connection exists between the interconnect and a corresponding one of the interposer interconnects in the second array of interposer interconnects. An array of connections for a peripheral circuit on each single interposer is connected to the at least one conductive trace.

Above motherboard interposer with quarter wavelength electrical paths

Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods are disclosed. An arrangement in accordance with one embodiment includes a microelectronic substrate having a first major surface, a second major face facing opposite from the first major surface, and electrically conductive through-substrate vias extending through the substrate and electrically accessible from both the first and second surfaces. The arrangement further includes a first translator releasably connected to the substrate and positioned in a first region extending outwardly from the first surface, the first translator including first electrical signal paths that access the vias from the first surface, and a second translator releasably connected to the substrate simultaneously with the first translator, the second translator being positioned in a second region extending outwardly from the second surface, the second translator including second electrical signal paths that access the vias from the second surface.

Translators coupleable to opposing surfaces of microelectronic substrates for testing, and associated systems and methods

A wafer translator and a wafer, removably attached to each other, provides the electrical connection to electrical contacts on integrated circuits on a wafer in such a manner that the electrical contacts are substantially undamaged in the process of making such electrical connections. Various embodiments of the present invention provide a gasketless sealing means for facilitating the formation by vacuum attachment of the wafer/wafer translator pair. In this way, no gasket is required to be disposed between the wafer and the wafer translator. Air, or gas, is evacuated from between the wafer and wafer translator through one or more evacuation pathways in the gasketless sealing means.

Maintaining a wafer/wafer translator pair in an attached state free of a gasket disposed

Maintaining a wafer/wafer translator pair in an attached state free of a gasket diposed

A computing device has a circuit substrate having a socket, a main processor inserted into the socket, an interposer substrate inserted between the socket and the main processor, the circuit substrate, the socket and the interposer substrate being electrically connected, and peripheral circuit modules residing on the interposer substrate, wherein each peripheral circuit module has an electrical path having a path length to the main processor less than one-quarter of a wavelength of signals that will travel the electrical path.

Methods and apparatus for testing unsingulated integrated circuits on a wafer include adapting a wafer prober for use with full-wafer-contacter disposed on the wafer. Some embodiments include placing wafer on a chuck of the prober, aligning the wafer to a full-wafer contacter incorporated in the wafer prober, removably attaching the wafer to the full wafer contacter, separating the wafer from the chuck, and making electrical contact to one or more integrated circuits of the wafer by making physical contact with a surface of the full-wafer contacter that faces away from the wafer.

Wafer prober integrated with full-wafer contactor

A computing device has a motherboard circuit substrate having at least one layer of electrical interconnects and a socket arranged to receive a main processor for the computing device, the socket electrically coupled to at least a portion of the layer of electrical interconnects, wherein the circuit substrate has no memory interconnects.

Growing community of inventors

Hillsboro, OR, United States of America

Morgan T Johnson