Technion Research & Development Foundation Ltd

Mordechay Segev

Ido Kaminer

Gal Harari

Maor Mutzafi

Zvika Katz

An electron beam shaping unit for use in electron beam column and a method for designing thereof is presented. The electron beam shaping unit is configured for affecting electron beams of high density or strong electron-electron repulsion. These 5 beams can always be modeled with multi electron wave function. The electron beam shaping unit comprises a mask unit configured for affecting propagation of electrons therethrough to thereby form a propagating electron beam having, at far field, radial shape as determined by multi-electron non-linear function being an eigen function determined by a multi-electron Hartree-Fock Hamiltonian.

System and method for use in electron microscopy

A system and method for detecting a sound originating from a body and enhancing signal-to-noise ratio with respect to noise originated outside the body is disclosed. The system comprises a light source for producing a quasi-monochromatic, spatially-coherent light beam; and interferometer for interfering alight beam originated from the source, incident upon the body and reflected from it, with a reference beam, which also originates from the light source; and a detector for detecting changes caused by motion of a least one interference fringe across the detector, and for generation a corresponding electric signal.

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Haifa, Israel

Mordechay Segev