Skhynix Inc.

Hynix Semiconductor Inc.

Moon Soo Sung

Chang Hyun Han

Sung Lae Oh

Yong Tae Kim

Jeong Hwan Kim

Dong Hun Kwak

Marco Passerini

Won Jae Choi

Woo Pyo Jeong

Dario Melchionni

Miriam Sangalli

Giulio Maria Iadicicco

A semiconductor device includes a gate structure including a first select line, a second select line, a first wordline, a second wordline, and a third select line. The semiconductor device also includes a first channel layer passing through the second wordline and the third select line. The semiconductor device further includes a second channel layer passing through the first wordline and the first select line, the second channel layer connected to the first channel layer, and a third channel layer passing through the first wordline and the second select line, the third channel layer connected to the first channel layer. The semiconductor device additionally includes an isolation structure that isolates the second channel layer from the third channel layer.

Semiconductor device having channel isolation structure

A semiconductor device may include a memory cell array including a first memory string that is connected to a first drain selection line and a second memory string that is connected to a second drain selection line, a control circuit configured to generate a first switch control signal and a second switch control signal based on an address signal, a first switch disposed in a direction corresponding to the first drain selection line and configured to connect a global word line with a local word line or disconnect the global word line from the local word line based on the first switch control signal, and a second switch disposed in a direction corresponding to the second drain selection line and configured to connect the global word line with the local word line or disconnect the global word line from the local word line based on the second switch control signal.

Semiconductor device and operating method for controlling driving direction of word line

A semiconductor device may include: a cell array including memory cells connected to local word lines; pass transistors that connect global word lines and the local word lines in response to a block selection signal; an operation voltage supplying circuit that applies a read voltage or a pass voltage to the global word lines; and a well bias supplying circuit that, during a read operation, applies a well bias having a negative level to a well region of the pass transistor connected to a selected local word line, in a discharge period in which an unselected local word line is discharged.

Semiconductor device and operating method of semiconductor device

Provided herein may be a nonvolatile semiconductor memory device. The nonvolatile semiconductor memory device may include a memory cell array, a read and write circuit, and a control logic. The memory cell array may include a plurality of nonvolatile memory cells. The read and write circuit may be configured to perform a program operation or a read operation on nonvolatile memory cells that are selected from among the plurality of nonvolatile memory cells. The control logic may be configured to control an operation of the read and write circuit. The read and write circuit may include at least one capacitor configured to store bit data.

Nonvolatile semiconductor memory device including a data storing capacitor in each page buffer

A switching architecture provides input voltage signals from input voltage lines to a plurality of global word lines connected to word lines of a memory array in a memory device. The switching architecture includes a first switching block receiving a first set of positive voltages used to bias unselected word lines and being connected to a first output line providing a first output bias voltage, and a second switching block receiving a second set of positive voltages and a third set of negative voltages used to bias selected word lines and being connected to a second output line providing a second output bias voltage. A plurality of final switches are input connected to the first and second output lines and are output connected to a respective global word line.

Switching architecture for a NAND flash memory device and a high voltage switch circuit

A global word line decoder may include a voltage switching unit and a plane switching unit. The voltage switching unit may decode a plurality of operating voltages to output a selected voltage and an unselected voltage, and the plane switching unit may receive the selected voltage and the unselected voltage, and decode the selected voltage and the unselected voltage to output decoded voltages to a global word line coupled to a selected plane, among a plurality of planes. The selected voltage may include a first pre-decoded voltage and a second pre-decoded voltage, and the plane switching unit may swap and output the first pre-decoded voltage and the second pre-decoded voltage according to a position of a selected word line.

Global wordline decoder and semiconductor device having the same

A trimming circuit may include a code table storing unit configured to store a plurality of test codes, a test voltage generating unit configured to generate test voltages in response to the test codes output by the code table storing unit, and a trimming unit configured to exchange and compare the test voltages and a reference voltage and output first and second pass signals. The trimming circuit may include a code table temporarily storing unit configured to store a test code from among the test codes as a first test code in response to the output of the first pass signal, and store a test code from among the test codes as a second test code in response to the output of the second pass signal, and a calculating unit configured to generate an intermediate code of the first and second test codes as a trimming code.

Trimming circuit and semiconductor system including the same

A voltage generator includes a clock generator configured to generate a first clock signal and a second clock signal having a longer cycle than the first clock signal, a pumping unit configured to generate a pumping voltage in response to the first or second clock signal, a first detection circuit configured to detect the pumping voltage and generate a first control signal for controlling the operation of the pumping unit based on the result of the detection, and a second detection circuit configured to generate a second control signal for outputting the first or second clock signal generated from the clock generator depending on whether the first control signal maintains an enable state for a specific time.

Voltage generator and method of generating voltage

A pump circuit includes a plurality of clock control circuits configured to transfer a clock to respective output terminals in response to respective pump-off signals or block the clock from being transferred to the respective output terminals, a plurality of charge pumps configured to generate respective high voltages by performing respective pumping operations in response to respective clock signals of the output terminals, and a plurality of switching circuits configured to transfer the respective high voltages to a final output terminal in response to respective control signals.

Pump circuit and semiconductor memory device including the same

A nonvolatile semiconductor memory apparatus includes a control unit configured to generate a select signal and a driving control signal in response to a first enable signal and a second enable signal; a level shifting unit configured to enable a first shifting signal or a second shifting signal to a level of a pumping voltage in response to the select signal and the driving control signal; a first switching unit configured to apply a program voltage to a word line when the first shifting signal is enabled to the level of the pumping voltage; and a second switching unit configured to apply a pass voltage to the word line when the second shifting signal is enabled to the level of the pumping voltage.

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Seoul, South Korea

Moon Soo Sung