University of Missouri

Mohammad Tayeb Ahmad Ghasr

Reza Zoughi

Sergiy Kharkivskiy

David Johannes Pommerenke

Mohamed Ahmed AbouKhousa

A sensor array having a plurality of modulated slots for microwave and/or millimeter wave imaging. The locations of the slots in the array define a spatial domain away from an object for detecting an electric field from the object. Each of the slots outputs a signal representative of the measured field and the location of the slot. A processor decodes the signals and generates an image of the object.

Microwave and millimeter wave imaging system

An apparatus for inspecting a sample for defects includes a signal generator for generating a signal and a device for splitting the signal into two separate signals which have substantially equal phase and magnitude. A sensor radiates the two signals on the sample and receives the two signals reflected from the sample. A device is provided for determining a difference between the two signals reflected from the sample without unwanted influence of variations of distance between the sensor and sample, and reflections from nearby sample edges and boundaries. A defect is determined to exist when a difference is found between the two reflected signals.

Growing community of inventors

Rolla, MO, United States of America

Mohammad Tayeb Ahmad Ghasr