Qualcomm Incorporated

Mohammad Reza Kakoee

Shih-Hsin Jason Hu

Navid Toosizadeh

Rahul Gulati

Mohamed Waleed Allam

Jasmin Smaila Ibrahimovic

Dexter Tamio Chun

Suresh Kumar Venkumahanti

Eric W Mahurin

Nan Chen

Keith Alan Bowman

Palkesh Jain

Lam Ho

Sorin Adrian Dobre

Saravana Krishnan Kannan

Pranjal Bhuyan

Min Chen

Carlos Auyon

A system and a method for error-correction code ('ECC') error handling is described herein. In one aspect, the system and method may operate an ECC function on raw data. The ECC function may include generating ECC syndrome data by an ECC syndrome data generating module. The ECC syndrome data may be derived from the raw data. The system and a method may further inject a fault based on the ECC syndrome data or the raw data. The system and a method may further determine whether the ECC error detected by the ECC checker corresponds to a malfunction of the ECC function or the fault injected based on the ECC syndrome data or the raw data.

System and method for online functional testing for error-correcting code function

Various additional and alternative aspects are described herein. In some aspects, the present disclosure provides a method of testing error-correcting code (ECC) logic. The method includes receiving data for storage in a memory. The method further includes receiving an address indicating a location in the memory to store the data. The method further includes determining if the received address matches at least one of one or more test addresses. The method further includes operating the ECC logic in a normal mode when the received address does not match at least one of the one or more test addresses. The method further includes operating the ECC logic in a test mode when the received address does match at least one of the one or more test addresses.

Error correcting code testing

In certain aspects, a system comprises a voltage-droop mitigation circuit configured to monitor voltage droop in a supply voltage supplied to a circuit, and to perform voltage-droop mitigation for the circuit if the monitored voltage droop is equal to or greater than a droop threshold. In one aspect, the system also includes a performance monitor configured to track a number of clock cycles over which the voltage-droop mitigation circuit performs the voltage-droop mitigation within a time duration, and to adjust the droop threshold based on the number of clock cycles. In another aspect, the system also includes a performance monitor configured to track a number of times that the voltage-droop mitigation circuit performs the voltage-droop mitigation within a time duration, and to adjust the droop threshold based on the number of times that the voltage-droop mitigation circuit performs the voltage-droop mitigation within the time duration.

Dynamically adaptive voltage-frequency guardband control circuit

A method including receiving an indication of a number of active processing units in a computer processor; in response to receiving the indication, determining an appropriate operating voltage margin for the computer processor; reducing an operating frequency of the active processing units in response to receiving the indication; adjusting a power supply to increase or decrease a voltage to the computer processor in accordance with the appropriate operating voltage margin; and increasing the operating frequency of the active processing units in response to an acknowledgment that the power supply has been adjusted.

Circuits and methods providing voltage adjustment as processor cores become active based on an observed number of ring oscillator clock ticks

An integrated circuit compensates for circuit aging by measuring the aging with an aging sensor and controlling a supply voltage based on the measured aging. The operating environment for the aging sensor can be set to reduce impacts of non-aging effects on the measured aging. For example, the operating environment can use a temperature inversion voltage. An initial aging measurement value which is the difference between an initial aged measurement and an initial unaged measurement can be stored on the integrated circuit. A core power reduction controller can use the measured aging and the stored initial aging measurement value to update a performance-sensor target value and then perform adaptive voltage scaling using the using the updated performance-sensor target value.

Integrated circuit adaptive voltage scaling with de-aging

The systems and method described herein provide efficient (e.g., low power and low area) techniques to track performance in numerous supply domains with heterogeneous circuits that are used in a large system-on-a-chip integrated circuit (SoCs). The heterogeneous circuits can include circuits made with different devices, different cell libraries, and different hard macros that are in different power supply domains. Performance measurements from performance sensors (or process-voltage-temperature (PVT) sensors) that are spread about the SoC are collected and processed to determine voltage levels for each of the supply domains. A single controller can receive can determine voltage levels for a whole SoC. The performance sensors are connected to the controller by a scan chain. The techniques are flexible and can be easily adapted for use in SoCs with different power supply domains and types of circuits.

Multi-domain heterogeneous process-voltage-temperature tracking for integrated circuit power reduction

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San Diego, CA, United States of America

Mohammad Reza Kakoee