Texas Instruments Corporation

Mohammad Atiqur Rahman

Michael James Mills

Alan Martin Gilkes

Nagesh Narayana Swamy

Umashankar S Iyer

Eric Beljaars

Alan Martin Gilker

Methods, apparatus, systems and articles of manufacture are disclosed to allow dynamic changing between current limiting methods. A power delivery controller comprising: a power control device; a first current control device, the first current control device to control the power control device when a current level associated with a current flowing between a first device and a second device exceeds a first adjustable current threshold value; a second current control device to control the power control device when the current level exceeds a second adjustable current threshold value; and a configuration manager to, during runtime, set a first configuration setting of the first current control device and a second configuration setting of the second current control device, the first configuration setting and second configuration setting based on a negotiated contract corresponding to the first device and the second device.

Methods and apparatus to dynamically limit current

In at least some disclosed embodiments, a method includes receiving a burst of data out of multiple bursts of data subject to long-term frequency drift and short-term frequency drift, determining an intercept of the long-term frequency drift based on, at most, the entire burst, and compensating for the long-term drift of a subsequent burst based on the intercept. The method further includes determining a slope of the short-term frequency drift, and compensating for the short-term frequency drift of a subsequent burst based on the slope.

Methods and apparatus for crystal oscillator drift estimation and compensation

Methods and apparatus to detect integrity failures in satellite position system (SPS) receivers are disclosed. An example method comprises estimating a position fix from a plurality of pseudoranges, computing a zero-mean error vector based upon the position fix; and determining if an integrity failure has occurred based on the zero-mean error vector.

Growing community of inventors

Allen, TX, United States of America

Mohammad Atiqur Rahman