Mentor Graphics Corporation

Mohamed Dessouky

Janusz Rajski

Nilanjan Mukherjee

Mark A Kassab

Thomas Hans Rinderknecht

Mona Safar

Rami Fathy Salem

Ahmed Arafa

Moaz Magdy Mustafa

Sherif Hany Mousa

Abdelrahman ElMously

Walid Farouk Mohamed

Haitham Mohamed Eissa

This application discloses a computing system to check and generate an assertion statement. The assertion statement, when executed during a simulation of a circuit design, can verify a simulated behavior of the circuit design. The computing system can extract sequence items from the assertion statement, and generate a state representation for the sequence items based on the simulated behavior of the circuit design. The state representation can identify states of the extracted sequence items at different clock ticks of the simulation. The computing system can locate an error in the assertion statement based on the state representation by generating patterns from sequence operators in the assertion statement and comparing the patterns to the state representation. The computing system can utilize the error in the assertion statement to generate a corrected assertion statement. The computing system can utilize propagate-and-repeat functionality to generate assertions by determining when to check each sequence item.

Assertion statement check and debug

Aspects of the invention relate to techniques for detecting and correcting electrical hotspots in a layout design for a circuit design comprising an analog circuit. Layout parameters for device instances associated with electrical constraints are first extracted. Based on the extracted layout parameters, electrical parameter variations for the device instances may be computed to identify one or more electrical hotspots in the layout design. A sensitivity analysis of the one or more electrical hotspots is performed to generate repair hints. Based on the repair hints, the layout design is adjusted.

Electrical hotspot detection, analysis and correction

Methods and devices for using high-speed serial links for scan testing are disclosed. The methods can work with any scheme of scan data compression or with uncompressed scan testing. The protocol and hardware to support high speed data transfer reside on both the tester and the device under test. Control data may be transferred along with scan data or be partially generated on chip. Clock signals for testing may be generated on chip as well. In various implementations, the SerDes (Serializer/Deserializer) may be shared with other applications. The Aurora Protocol may be used to transport industry standard protocols. To compensate for effects of asynchronous operation of a conventional high-speed serial link, buffers may be used. The high-speed serial interface may use a data conversion block to drive test cores.

Scan test application through high-speed serial input/outputs

Growing community of inventors

Cairo, Egypt

Mohamed Dessouky