Sintokogio, Ltd.

Mizuki Okubo

Eiji Yamaguchi

Nayuta Horie

Yuuka Ito

An ultrasonic inspection apparatus includes: an acquisition unit acquiring a signal indicating a fundamental wave and a second harmonic of an ultrasonic wave, which are obtained by the ultrasonic wave being scanned over an inspection object through a medium, at each scanning position; a calculation unit calculating a value obtained by dividing a second harmonic amplitude by a square of a fundamental wave amplitude, at each scanning position; and an output unit outputting information on a defect of the inspection object, based on the value obtained by dividing the second harmonic amplitude by the square of the fundamental wave amplitude.

Growing community of inventors

Toyokawa, Japan

Mizuki Okubo