Olympus Optical Company, Ltd.

Miyazaki, Atsushi

Shinichi Kato

Susumu Takahashi

Takeaki Nakamura

Shinichi Nishigaki

Yoshio Shishido

Akibumi Ishikawa

Matsuo, Kazumasa

An apparatus for detecting a focused condition of an optical system, in which a light-receiving means arranged at a fixed position corresponding to a focus position photometrically detects a focused condition. A light beam having a definite shape is projected onto an object to be imaged by a light projection means. The reflected light beam is conducted along an optical axis of the optical system, deflected, and detected by the light receiving means for determining whether a focused condition exists. Several embodiments are disclosed for projecting a light spot of high contrast on the object and for detecting a focused condition on the basis of the intensity distribution of light received by the light-receiving means. The apparatus may be applied to an endoscope and other optical systems.

Apparatus for photometrically detecting an optically focused condition

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Hachioji, Japan

Miyazaki, Atsushi