Olympus Corporation

Olympus Optical Company, Ltd.

Mitsuru Namiki

Ikutoshi Fukushima

Atsuyoshi Shimamoto

Takeshi Hashimoto

Keiichiro Nakajima

Masashi Yamada

Yuji Sakai

Takamitsu Sakamoto

Mikihiko Terashima

Koji Matsumoto

Yoshimasa Suzuki

Hirofumi Tsuchida

Tomoki Funakubo

Hiroyuki Minakata

Yasunobu Iga

Masahiro Yoshino

Kimiaki Yamamoto

Junichi Nishimura

Yu Kondo

Takehiro Miki

Yoko Okabe

An endoscope apparatus includes: a light source that radiates a pulsed light beam onto an imaging subject; an imaging optical system; an image transmission optical system that transmits the image of the imaging subject; an optical sensor that has a light receiving surface on which a plurality of pixels are arrayed and that detects a light level of the image; and one or more processors, wherein the optical sensor obtains light levels by detecting, in a time division manner, a reflected light beam of the pulsed light beam at each of the pixels, and wherein the processors are configured to: calculate an observation distance to the imaging subject from the imaging optical system on a basis of the light levels.

Endoscope apparatus

Provided is an objective optical system including: a first spherical lens and a second spherical lens that are arrayed in this order from an object; and at least one of a first optical medium and a second optical medium, wherein the first optical medium is a solid or liquid disposed at an object side of the first spherical lens and is in close contact with a surface on the object side of the first spherical lens, over an entire optical path; and the second optical medium is a solid or liquid disposed at an opposite side of the second spherical lens from the object and is in close contact with a surface on the opposite side of the second spherical lens from the object, over the entire optical path.

Objective optical system

A lithotripsy apparatus includes: a treatment laser beam source that emits a treatment laser beam that crushes a stone; a guide light source that emits guide light; a photodetector that detects return light that returns as a result of the emitted guide light being reflected at the stone; and a processor including hardware, the processor being configured to: measure a distance from the treatment laser beam source to the stone on the basis of the return light; determine a condition of a bubble occurring between the treatment laser beam source and the stone on the basis of the measured distance; and adjust a light quantity of the treatment laser beam on the basis of the determined condition of the bubble.

Lithotripsy apparatus and lithotripsy system

A light treatment system includes: a probe configured to be inserted into a body cavity, the probe including an optical fiber configured to propagate light, and a light emitter that is provided at a distal end of the optical fiber, the emitter being configured to emit the light; a balloon catheter into which the probe is inserted, the balloon catheter including a distal end portion that is to be inserted into the body cavity and that is to be dilated by being supplied with a liquid including air bubbles; and an air bubble generator configured to generate the air bubbles to be included in the liquid and change a property of the air bubbles.

Light treatment system and light treatment method

An optical-scanning-type observation probe is provided with: an imaging optical system that illumination light scanned by an optical scanner enters and that focuses the illumination light in the form of a spot, multiple times; a projection optical system that emits illumination light coming from a focus position focused by the imaging optical system, toward a subject in the form of a spot; and a light-receiver that is provided independently of the imaging optical system and the projection optical system and that receives reflected light of the illumination light, the reflected light coming from the subject, via a light path different from that of the imaging optical system and the projection optical system.

Optical-scanning-type observation probe and optical-scanning-type observation device

Provided is a scanning endoscope system including: an illumination-light emitting portion that is inserted into a body of a patient and that emits illumination light emitted from a light-source portion toward an imaging subject in the body in a spot-like manner; a light scanner that scans the illumination light on the imaging subject; and a light detector that is disposed at a body surface of the patient, and that detects reflected light coming from the scanning position in the imaging subject, at which the illumination light is scanned by the light scanner.

Scanning endoscope system

An apparatus for measuring a scanning pattern of an optical scanning apparatus can easily reduce the effect of stray light and improve the measurement accuracy of the scanning pattern. An apparatus for measuring a scanning pattern of an optical scanning apparatus (), which scans an object being illuminated with illumination light and generates a display image of the object being illuminated, includes a screen () scanned by the illumination light and an optical position detector () that detects the position of an irradiation spot of the illumination light on the screen (). The apparatus for measuring a scanning pattern sequentially detects a position of the irradiation spot at predetermined time points with the optical position detector () during scanning of the screen () to measure the scanning pattern of the illumination light.

Method for measuring scanning pattern of optical scanning apparatus, apparatus for measuring scanning pattern, and method for calibrating image

An endoscope has an insertion portion inserted through a living body, an illumination fiber arranged at a distal end of the insertion portion and irradiates the living body with illumination light, a detection fiber which detects return light from the living body, an actuator which swings a free end of the illumination fiber, and a ferrule which has a through-hole based on a diameter of the illumination fiber and is arranged between the illumination fiber and the actuator. The actuator has an actuator arranged at a first side face of the ferrule and an actuator arranged at a second side face of the ferrule that is different from a face point-symmetric to the first side face with respect to an axial direction of the illumination fiber.

Endoscope and endoscope apparatus having piezoelectric element which swings a free end of an optical element through a joining member

A measuring instrument has a light source for irradiating light including rays of light having the wavelength of excitation light, an objective lens for focusing light irradiated from the light source to a predetermined focusing position, a first mirror for directly reflecting light from the objective lens, a second mirror for reflecting light reflected by the first mirror, the second mirror having an aperture P, and a measuring device for measuring light generated from a sample and having a wavelength different from the wavelength of excitation light, and the sample being arranged between the first mirror and the second mirror, the focusing position of the objective lens being made to agree with the position of the aperture P, and the measuring device being adapted to measure light of a wavelength different from the wavelength of excitation light generated from the sample and passing through the aperture P.

Measuring instrument and measuring method

A mirror unit consists of a half mirror and a mirror unit. The half mirror generates a transmitted light and a reflected light. A pair of the mirror units is arranged on one side and the other side of the half mirror so that the transmitted light and the reflected light split by the half mirror are deflected and are combined again at a common place on the half mirror. The mirror unit also has plural mirrors and is arranged to make the optical length variable by shifting the mirror unit toward one direction with a moving mechanism.

Optical pulse multiplex unit

A light pulse multiprocessing unit has a half mirror and N delay elements, each having a refractive index n. The N delay elements are arranged on one side of the half mirror from one end of the half mirror toward the other end and have thicknesses &#x394;, 2&#x394;, . . . , 2&#x394; different from each other, where &#x394; is the smallest thickness. The half mirror is placed in parallel in the proximity of an intermediate position between two mirrors and the N delay elements are arranged between one of the mirrors and the half mirror. Each of the N delay elements is a plane-parallel plate and is placed at an angle such that the direction of the normal line of the surface of the plane-parallel plate is different from a direction followed from one end of the half mirror toward the other end.

Light pulse multiprocessing unit, light pulse generator using the same, and light pulse multiprocessing method

An optical unit includes a light source unit emitting parallel light; a light-receiving element array; and a prism rendering emitted light from the light source unit incident on a specimen placement section and introducing totally reflected light from the specimen placement section into the light-receiving element array. The prism has an entrance surface rendering the parallel light emitted from the light source unit incident on the prism, a curved reflecting surface which reflects light passing through the entrance surface and incident on the prism toward a focal position thereof, the specimen placement section of a planar shape provided at a position including the focal position of the curved reflecting surface, and an exit surface making light totally reflected at the focal position of the curved reflecting surface in the specimen placement section emerge into the outside of the prism.

Optical unit

A microscope apparatus includes a microscope, and a time-resolved spectroscopy unit, a first light-guiding unit for guiding light from the speetroscopy unit into the microscope, a second light-guiding unit for guiding the light from the microscope into the spectroscopy unit. The microscope includes an illuminating optical system and an observing optical system. The time-resolved spectroscopy unit includes an ultrashort optical pulse source, a beam splitter for splitting the ultrashort optical pulse into a reference beam and another beam, an optical system for generating a pump beam and a probe beam from the beam other than the reference beam, and an imaging device for time-resolved spectroscopy for capturing an interference pattern formed by the light guided by the second light-guiding unit and the reference beam. A two-dimensional lightwave conversion optical system is interposed between the second light-guiding unit and the imaging device.

Microscope apparatus

An apparatus for measuring the eccentricity of the aspherical surface has a light source unit; a condenser lens condensing light rays in the proximity of the center of paraxial curvature of a surface to be examined, of an aspherical lens; an angle changing means for entering the rays on the surface to be examined, at angles &#x3b8;1i (i=1, 2, . . . , N) with an optical axis; a holding tool of the aspherical lens; a light-splitting element; an imaging lens; a light-detecting element detecting the situation of light collected by the imaging lens; and an arithmetical unit. The arithmetical unit is such as to calculate the amount of eccentricity of the surface to be examined, from amounts of shift &#x394;P1i (i=1, 2, . . . , N) between spot positions P1i (i=1, 2, . . . , N) based on the design data of the surface to be examined and spot positions P1mi (i=1, 2, . . . , N) derived from the light-detecting element, with respect to light rays Q1i (i=1, 2, . . . , N) produced by the angle changing means.

Apparatus and method for measuring eccentricity of aspherical surface

A focal length measuring device comprises a light source unit for generating a collimated light, a diffraction grating for deflecting the collimated light by a deflection angle &#x3b8;, and an image-pickup element for measuring a position of a focused spot light after the deflected light passes the lens to be tested. The diffracting grating is disposed near a front focal plane of the lens to be tested. The image-pickup element is disposed near a rear focal plane of the lens to be tested. A focal length is calculated according to a relationship such as h=f tan &#x3b8; under condition that h indicates an image height as a distance from the optical axis. By doing this, it is possible to measure the focal length accurately and easily while restricting an influence of a depth of focus and an aberration.

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Hanno, Japan

Mitsuru Namiki