Kabushiki Kaisha Topcon

Topcon Corporation

Mitsuru Kanokogi

Masahiro Ohishi

Yasushi Tanaka

Takaaki Saito

Ken'ichiro Yoshino

Kaoru Kumagai

Masaaki Yabe

Ken-ichiro Yoshino

Masae Matsumoto

A 3-dimensional measuring device includes: a light source unit; a projection optical system; a scanning mirror that is provided to be rotatable about a rotating shaft in a state of being inclined with respect to a shaft center of the rotating shaft to radiate a range-finding light within a plane crossing the rotating shaft in a rotary manner; a light-receiving optical system that receives a reflection range-finding light; a reference light optical system that is provided in a range outside a measuring range within a radiation range to receive and reflect the range-finding light as an internal reference light, the reference light optical system being capable of changing a light quantity of the internal reference light; and a light receiving element that receives the reflection range-finding light and the internal reference light.

3-dimensional measuring device

An electronic distance measuring instrument comprises a pulsed light emitting light source, means for creating a distance measuring pulsed light and an internal reference pulsed light, a photodetector for detecting the pulsed lights, and a measuring unit for calculating a distance to an object to be measured based on a photodetection signal. The measuring unit performs coarse distance measurement based on difference of photodetection time between the internal reference pulsed light and the distance measuring pulsed light, carries out Fourier function transform on photodetection waveform of the pulsed lights respectively, separates the waveforms to a plurality of frequency components, obtains phase difference for each of the frequency components acquired, performs fine distance measurement based on time difference acquired from phase difference, and measures a distance to the object by adding a result of coarse distance measurement to a result of fine distance measurement.

Electronic distance measuring method and electronic distance measuring instrument

The present invention provides an electro-optical distance measurement, wherein a light from a light source () is projected toward an object to be measured (), a reflection light reflected by the object to be measured is received at a photodetection unit (), the light from the light source is received by the photodetection unit as an inner light via an inner optical path (), and a distance to the object to be measured is measured according to the result of photodetection of the reflection light and the inner light of the photodetection unit, and wherein a correction information is acquired based on the inner light, the acquired correction information is stored, a correction value is obtained from the correction information based on the reflection light and the inner light, and a distance is calculated from the correction value and the result of photodetection of the reflection light and the inner light.

Electro-optical distance measuring method and electro-optical distance measuring device

A distance measuring system, which comprises a control arithmetic unit , a light emitting unit for emitting a measuring light beam and a photodetection unit for receiving a reflection light beam from an object to be measured, the system being used for measuring a distance by receiving the reflection light beam from the object to be measured, wherein the control arithmetic unit compares a signal based on the photodetection amount of the reflection light from the object to be measured as well as a result of the distance measurement with reference data prestored in the control arithmetic unit relating to the reflection of the object to be measured, and judges whether the object to be measured is a prism or a natural object based on a result of the comparison.

Distance measuring system

The present invention relates to a distance measuring apparatus utilizing light waves, in particular the distance measuring apparatus is able to measure a distance effectively even in an environment containing such a noise light as to disturb the measurement by light waves. In the above-mentioned apparatus, the projection system irradiates the target of measurement with light beams, the light reception means in the light reception system receives the reflected light beams, and the processing means calculates the distance from the measuring position to the target of measurement based on the reflected light beams. The threshold level of the light reception means for judging the incidence of reflected light beams is made variable.

Growing community of inventors

Tokyo-to, Japan

Mitsuru Kanokogi