Hitachi, Ltd.

Mitsuo Suda

Hirotsugu Fukuoka

Kanji Kawakami

Hiroshi Fukui

Yutaka Sugita

Kazuo Shiiki

Shinji Narishige

Norifumi Miyamoto

Masanori Tanabe

Makoto Aihara

Yukihiro Isono

Kouichi Shimizu

Eiji Nakanishi

Kouji Takeshita

A magnetic recording device includes a magnetic disk for storing information, a magnetic head for writing and reading information relative to the magnetic disk, a device for rotating the magnetic disk relative to the magnetic head in such a manner that speed of said magnetic disk relative to the magnetic head is 6 to 40 m/s at an innermost track of the magnetic disk, and a device for applying a load to the magnetic head so that a gap between the magnetic disk and the magnetic head disposed in opposed relation to the magnetic disk can be kept to not more than 0.1 .mu.m.

Magnetic recording apparatus with magnetic head on slider having applied

In a magnetic disk device having a composite head with an induction type of recording head adjacent a magneto-resistance effect type of reproducing head, a read error relief is provided to relieve read errors caused by Barkhausen Noise or Base Line Shift phenomenon inherent to the magneto-resistance effect type of reproducing head. Upon occurrence of a read error, a re-try function is first executed, and a track offset function is executed for relief of the read error. However, if the read error is not relieved after the offset operation and the re-try operation have been performed a predetermined number of times, then a pseudo write-in and/or read current control operation is performed together with the offset operation and/or re-try operation for a predetermined number of times. The control operation varies the magnetic domain structure in the head magnetic film (MR film). The variation of magnetic field and/or read current in the head magnetic film causes the magnetic domain structure of the head magnetic film to be varied, so that the Barkhausen Noise or the Base Line Shift phenomenon are extinguished.

Magneto-resistance effect type of recording/reproducing head

DC bias currents are applied to a conducting wire of a thin film magnetic head to be inspected. When the DC bias currents (I.sub.0, I.sub.1, I.sub.2) are supplied to the conducting wire, the impedances (Z.sub.0, Z.sub.1, Z.sub.2) corresponding to the DC bias currents are measured. When a ratio (.vertline.Z.sub.1 -Z.sub.0 .vertline./.vertline.Z.sub.2 -Z.sub.0 .vertline.) corresponding to an overwrite characteristic (OW) reaches to a predetermined value by lapping tip portions of an upper magnetic layer and a lower magnetic layer of the magnetic head, the lapping process of the magnetic head is finished.

Method for making a thin film magnetic head

Growing community of inventors

Odawara, Japan

Mitsuo Suda