Happyjapan, Inc.

Mitsuo Koizumi

Masayoshi Yokoo

Keitaro Harada

Shouhei Matsumoto

Satoshi Ueno

Yoshinori Arai

Shinichi Hasebe

Fumiaki Togashi

An IC deviceof the present invention includes a robot armfor conveying IC devices D to a test headfor testing the IC devices. The test headincludes socketshaving placement surfacesonto which the IC devices D are placed and for attaching the IC devices placed on the placement surfaces to the test head. The robot armincludes a contact headfor holding the IC devices while the IC devices are conveyed and for pressing the IC devices onto the test head during testing, and a non-contact displacement meterthat moves in association with the movement of the contact head. The non-contact displacement meteris mounted on the robot armso as to measure a distance by emitting a beam in a direction perpendicular to the placement surfaces

IC test system

An IC handler () of the present invention transfers an IC device (D) to a test head (). The test head () is provided with a socket (), which has a placing surface () having the IC device (D) placed thereon, and which attaches the IC device (D) placed on the placing surface () to the test head (). The IC handler () is provided with a non-contact displacement meter () that is disposed by being spaced apart from the socket () in the direction perpendicular to the placing surface (). The non-contact displacement meter () measures a distance from the non-contact displacement meter () to the IC device (D) placed on the placing surface () by emitting a laser beam toward the placing surface () of the socket ().

IC handler

Growing community of inventors

Yamagata, Japan

Mitsuo Koizumi