Nippon Telegraph and Telephone Corporation

Ntt Advanced Technology Corporation

Kyoshin Electric Works, Ltd.

Mitsuo Hattori

Ryuichi Kobayashi

Tsuyoshi Ideguchi

Mamoru Sato

Shin Kanno

Kenji Iguchi

An output node at a plus side of a diode bridge (DB) is connected to a drain of a transistor (Q), and a source of the transistor (Q) is connected to an output node at a minus side the diode bridge (DB). One end of a resister (R) is connected to the drain of the transistor (Q), and the other end of the resister (R) is connected to a gate of the transistor (Q). One end of a resister (R) is connected to the gate of the transistor (Q), and the other end of the resister (R) is connected to the source of the transistor (Q). A capacitor (C) is connected in parallel to the resister (R).

Rush current reduction circuit and electric appliance

Voltages and currents of electromagnetic interference developed in cables or the like electrically connected to pieces of electronic equipment are respectively measured by non-contact voltage probes and non-contact current probes both of which have double coaxial cylindrical type inner and outer electrodes and wherein the outer electrode is grounded and a voltage output under capacitive coupling is taken out from the inner electrode. An effective component of energy of each propagating electromagnetic interference is calculated from the result of the measurements. An invading route of each electromagnetic interference is specified from the magnitude of the energy and the direction in which the energy flows. While the pieces of electronic equipment are being placed under operating conditions, the behavior of the electromagnetic interference can be accurately recognized and the invading route of each electromagnetic interference can be quantitatively specified according to a physical quantity.

Method and apparatus for searching electromagnetic disturbing source and

A non-contact voltage probe is used to measure the voltage of electromagnetic interference developed in a cable or the like electrically connected to pieces of electronic equipment. The non-contact voltage probe has double coaxial cylindrical-type inner and outer electrodes through which a cable or the like is passed. The inner electrode is electrically connected to a voltage detector, which measures the voltage induced by the capacitance between the inner electrode and the cable passing there through, and the outer electrode is grounded.

Non-contact voltage probe apparatus

Growing community of inventors

Tokyo, Japan

Mitsuo Hattori