Renesas Electronics Corporation

Mitsubishi Denki Kabushiki Kaisha

Mitsubishi Electric Engineering Company, Limited

Mitsumasa Murakami

Hiroshi Murakami

Akihiro Nakatani

Takeshi Ohtsuki

Masaya Hara

Akihisa Nomura

Shunya Yamane

Mamoru Morotomi

Aritsune Nagamura

An operation part calculates a shake amount of an imaging apparatus in accordance with a first operation system or a second operation system on the basis of an output signal of a sensor detecting an acceleration or angular velocity to determine a camera-shake correction amount correcting the shake amount. The operation part calculates the output signal of the sensor or a value obtained by integrating an integrated signal of the output signal of the sensor as a shake amount. The operation part includes an imperfect integrator. An operation system setting part sets an operation system of the operation part on the basis of the shake amount calculated by the operation part. In the second operation system, the operation system setting part increases a cut-off frequency of the imperfect integrator more than in the first operation system.

Camera controller

A method for calibrating a driving amount of an actuator configured to correct blurring of an image taken by a camera attached to a device includes: taking an image of a mark by a camera to generate a first image, the mark reflecting a predetermined posture of the device; detecting a tilt of the mark in the first image; and based on the tilt of the mark, correcting the driving amount of the actuator that is predetermined according to a sensing result of a sensor for sensing a change in a posture of the device.

Method for calibrating driving amount of actuator configured to correct blurring of image taken by camera

The invention provides a temperature-compensating circuit which comprises first degree and second degree temperature-coefficient-generating circuits respectively comprising an operational amplifier and a plurality of resistors each having different temperature coefficient, a sign-inverting circuit, and first degree and second degree temperature-coefficient-adjusting circuits. Resistance values of the resistors of the first degree and second degree temperature-coefficient-generating circuits are decided so that voltage amplification factors are linearly or quadratically changed as a temperature changes. The sign-inverting circuit inverts signs of temperature coefficients generated by the first degree and second degree temperature-coefficient-generating circuits and the first degree and second degree temperature-coefficient-adjusting circuits adjust temperature coefficients generated by the first degree and second degree temperature-coefficient-generating circuits to predetermined values. The temperature-compensating circuit generates any temperature coefficients necessary for temperature compensation to cancel an offset drift constant in the temperature characteristic of a sensor output and fluctuation components due to span-shift first degree and second degree temperature coefficients.

Temperature-coefficient-generating circuit and temperature-compensating circuit using the same

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Tokyo, Japan

Mitsumasa Murakami