Sony Corporation

Fujifilm Business Innovation Corp.

Hitachi High-Tech Corporation

Fuji Xerox Co., Ltd.

Hitachi-High-Technologies Corporation

Konica Minolta Business Technologies, Inc.

National Institute of Advanced Industrial Science and Technology

Fujitsu Corporation

Fuji Electric Co., Ltd.

Sony Computer Entertainment Inc.

Lapis Semiconductor Co., Ltd.

Mitsuhiro Nakamura

Masashi Matsumoto

Takayuki Uchiyama

Satoko Monoe

Takumi Uegane

Seiji Wada

Natsuki Kimura

Takuro Yamamoto

Haruhiko Soma

Tomoya Nishida

Michio Hatano

Masahiro Sasajima

Yusaku Nakashima

Satoshi Suzuki

Naofumi Yoneda

Yohei Fukuma

Natsuki Tsuno

Yoshiaki Watanabe

Rui Morisawa

Yohei Nakamura

Yusuke Seki

Tomohiro Hayakawa

Yoshiyuki Kitazawa

Shinichi Wada

Shiko Yamashita

Toshihiko Ogura

Yuji Ibusuki

Yuichi Adachi

Shinichi Tamari

Hidefumi Gotoh

Hironori Itabashi

Koji Wakizono

Koji Onodera

Taichi Fuchu

Fan Wang

Keisuke Tanuma

Hiroshi Kato

Hiroshi Ikeda

Yasushi Okumura

Tadashi Morita

Kenji Aoki

Koji Kashima

Takashi Tomita

Yoshihiro Wakita

Hiroshi Yasutomi

Tatsumi Sakaguchi

Yoji Kawamoto

Yasuhiko Nara

Toshihide Agemura

Yuji Suzuki

Keisuke Tejima

Takuya Makita

Hideaki Ozawa

Masanori Murakami

Shinichi Okamoto

Tomiji Tanaka

Hirohisa Tanaka

Hiroshi Toyama

Motomasa Futagami

Muneki Shimada

Yutaka Nobe

Yasumasa Nakatsugawa

Tsutomu Saito

Takumi Uezono

Toshiharu Takemura

Masaharu Yoshimori

Toyoshi Okada

Hidefumi Goto

Hidetoshi Kawasaki

Ichiro Hase

Kunji Shigeto

Ikuo Shinohara

Keiso Shimakawa

Hajime Yoshii

Tsutomu Saitou

Kotaro Hosoya

Ryoko Araki

Tsutomu Inui

Kenichi Katayama

Takayuki Fukamachi

Naoto Terao

Seiichi Adachi

Masato Kamio

Tomoharu Obuki

Makoto Kubo

Yasuo Watanabe

Toshimitsu Higashikawa

Hirofumi Satou

Hiroki Kannami

Toshihisa Yokoi

Masahiro Kinoshita

Mitsumasa Ogura

Katsuo Oki

Yinglin Zhu

It is aimed to properly correct the various types of distortion without a reduction in observation throughput. The present disclosure provides a charged particle beam device that obtains an image by irradiating a specimen with a charged particle beam and includes: a deflection coil that scans the charged particle beam on the specimen; a D/A converter that converts a digital scan waveform into an analog scan waveform and outputs the analog scan waveform to the deflection coil to drive the deflection coil; and a scan waveform generation unit that generates a digital scan waveform and outputs the digital scan waveform to the D/A converter, in which the scan waveform generation unit has a basic LUT that stores parameters for correcting the digital scan waveform and includes a correction circuit that corrects a distortion characteristic of the deflection coil.

Charged particle beam device and scan waveform generation method

A dielectric microscopic observation is possible, which suppresses image flow regardless of scanning speed. There are provided a sample chamberholding a samplebetween a first insulating layeron which a conductive layerto be irradiated with a charged particle beam is laminated and a second insulating layer, an amplifierthat amplifies a potential change that occurs at an interface between the first insulating layer and the sample as the conductive layer is irradiated with the charged particle beam, and outputs the amplified result as a measurement signal, a main control unitthat converts the measurement signal from the amplifier into image data, and corrects the image data with a deconvolution filterto generate corrected image data, a display unitincluding an observation image display unitand a filter adjustment unitthat displays setting information of the deconvolution filter, and an information processing device that displays the corrected image data on the observation image display unit, and when the setting information of the deconvolution filter displayed in the filter adjustment unit is changed, adjusts the deconvolution filter according to the changed setting information.

Charged particle beam device and sample observation method

A sample holder reliably holds a liquid or gel sample, and the yield of observation with a charged particle beam device is improved. A sample holderincludes a first memberthat has a lid memberand a first chipprovided with a first windowwhere a laminated film including a first insulating thin filmis formed, and a second memberthat has a base materialhaving a first bottom seal surfaceand a second bottom seal surface, an electrodedisposed on the base material, and a second chipprovided with a second windowwhere a second insulating thin filmis formed and held on the second bottom seal surface via a second seal materialsuch that the second window faces the electrode, in which a region inside a first seal material is maintained airtightly from a region outside the first seal material by the first member and the second member being combined and the first seal material being crushed between the first bottom seal surface and an upper seal surface of the lid member.

Sample holder, intermembrane distance adjustment mechanism, and charged particle beam device

A risk of breakage of a sample holder can be reduced and a biochemical sample or a liquid sample can be observed easily and with a high observation throughput. A sample holderholding a sample includes: a sample chamber including a first insulating thin filmand a second insulating thin filmthat sandwich and hold the samplein a liquid or gel form and face each other, a vacuum partition wall inside which the sample chamber holding the sample is fixed in a state in which the thin film is exposed to a surrounding atmosphere, and whose internal space is kept at a degree of vacuum at least lower than that of the sample room at the time of observation of the sample, a detection electrodedisposed to face the second insulating thin film in a state in which the sample chamber is fixed to the vacuum partition wall, and a signal detection unitconnected to the detection electrode. Before the surrounding atmosphere of the sample holder is evacuated from an atmospheric pressure to a vacuum, the charged particle beam device receives a detection signal from the signal detection unit via a connector and detects an abnormality of the sample chamber based on the detection signal.

Thin film damage detection function and charged particle beam device

A recording medium processing apparatus includes first teeth that are used for binding processing of a recording medium bundle; second teeth that move toward the first teeth and press the recording medium bundle located between the first teeth and the second teeth; a position detection unit that detects a position of the second teeth; and a control unit that controls movement of the second teeth on the basis of the position detected by the position detection unit.

Recording medium processing apparatus and image forming system

A recording material processing apparatus includes: first teeth that are used for binding processing of a recording material bundle; second teeth configured to move toward the first teeth and to press the recording material bundle positioned between the first teeth and the second teeth; a first metal block configured to support the first teeth; and a second metal block configured to support the second teeth.

Recording material processing apparatus

A recording medium processing apparatus includes first teeth that are used for binding processing of a recording medium bundle; second teeth that move toward the first teeth and press the recording medium bundle located between the first teeth and the second teeth; and a control unit that moves the second teeth toward the first teeth to press the second teeth against the first teeth in a state in which there is no recording medium bundle between the first teeth and the second teeth.

A recording material processing apparatus includes first teeth that are used for binding processing of a recording material bundle; second teeth that move toward the first teeth and press the recording material bundle located between the first teeth and the second teeth; a guide portion that guides an interlocking portion interlocking with the second teeth; and a guided portion that is provided in the interlocking portion and guided by the guide portion, in which one of the guide portion and the guided portion includes a hole, and the other includes a rod-shaped portion that extends in a movement direction of the interlocking portion and comes into contact with an inner surface of the hole.

Recording material processing apparatus and image forming system

A shield case, joined to a circuit board on which electronic components are mounted and covering the electronic components, has a top plate portion covering the electronic components, and a plurality of terminal leg portions formed in a way of projecting in a direction intersecting with the top plate portion from a peripheral edge portion of the top plate portion. Each of the plurality of terminal leg portions has: a leg portion stretching from the top plate portion; a terminal portion which extends in a direction intersecting with the leg portion from a front-end of the leg portion and is joined to the circuit board; and an expansion terminal portion which is formed by bending a front-end portion of each of the terminal portions along an end surface of the circuit board and has a length exceeding a thickness of the circuit board.

Shield case and electronic circuit module

A manufacturing method of a staple-less binding unit that includes a first binding unit that has plural recesses and projections and a second binding unit that is arranged to face the first binding unit and has recesses and projections that fit to the recesses and the projections of the first binding unit and in which mediums are bound by being interposed between the first binding unit and the second binding unit in a thickness direction of the mediums includes forming the binding units with a die, adjusting center positions of projecting portions of the binding units formed by the die and removed from the die, and adjusting outer shapes of the projecting portions of which the center positions have been adjusted.

Manufacturing method of staple-less binding unit

Provided are a charged particle beam device and a detector capable of non-invasively observing a biochemical sample without a staining treatment or an immobilization treatment, with a simple and high observation throughput. An electron optics system, a stage, a sample chamberholding a sample and including a first insulating layerthat is in contact with the sample, and a conductive layerthat is formed on the first insulating layer, signal detection circuitsandconnected to the conductive layer and detecting a current flowing through the conductive layer, and a main control unitfor controlling the electron optics system and the stage, wherein the main control unitirradiates the conductive layer of the sample chamber placed on the stage with an electron beam from the electron optics system and is input with a detection signal from the signal detection circuit.

Charged particle beam device, autofocus processing method of charged particle beam device, and detector

A binding unit is a binding unit used in staple-less binding in which mediums are bound by being interposed between binding units having plural recesses and projections in a thickness direction of a bundle of the mediums, in which, among the plural projections, a tip end of a projecting portion, which is at a central portion in an arrangement direction of the projections, protrudes further than a projecting portion disposed at a position different from the central portion.

Binding unit and binding device

A recording material processing apparatus includes first teeth that are used for binding processing of a recording material bundle; second teeth that move along a linear route toward the first teeth and presses the recording material bundle located between the first teeth and the second teeth; and a guide portion that is disposed along the linear route and guides the second teeth moving toward the first teeth.

A measuring apparatus that irradiates a sample with a charged particle beam to observe the sample includes a particle source that outputs the charged particle beam, a lens that collects the charged particle beam, a detector that detects a signal of emitted electrons emitted from the sample which is irradiated with the charged particle beam, and a control device that controls the output of the charged particle beam and the detection of the signal of the emitted electrons in accordance with an observation condition, in which the control device sets, as the observation condition, a first parameter for controlling an irradiation cycle of the charged particle beam, a second parameter for controlling a pulse width of the pulsed charged particle beam, and a third parameter for controlling detection timing of the signal of the emitted electron within the irradiation time of the pulsed charged particle beam, and the third parameter is determined in accordance with a difference in intensity of signals of the plurality of the emitted electrons emitted from the irradiation position of the charged particle beam.

Measuring apparatus and method of setting observation condition

Growing community of inventors

Kanagawa, Japan

Mitsuhiro Nakamura