Panasonic Corporation

Panasonic Intellectual Property Management Co., Ltd.

Mitsuhiro Ikeda

Hiroshi Yamauchi

Mineo Tokunaga

Tatsuki Nogiwa

The present invention provides a secondary cell, wherein an area having generated therein a phenomenon due to an internal short-circuit can be freely changed, a change in the secondary cell due to the generation of the internal short-circuit is correctly grasped, and safety of the secondary cell can be accurately evaluated when the internal short-circuit is generated. An internal short-circuit test method for the secondary cell is also provided. In the present invention, the secondary cell is configured by disposing: an electrode group, which is formed by winding or laminating a positive electrode plate, a negative electrode plate, and an insulating layer disposed between the positive electrode plate and the negative electrode plate; and a heat generating body, which is disposed between the positive electrode plate and the insulating layer or between the negative electrode plate and the insulating layer.

Secondary cell and method for testing secondary cell

A substrate support jig, for removably holding a substrate when mounting electronic components on the substrate, includes a base member having a first surface and a second surface facing and substantially parallel to each other; and an adhesive layer with a predetermined shape and a predetermined thickness formed on the first surface side by applying an adhesive material with a predetermined unit tackiness to an adhesive region. In the adhesive region is formed a land section such that a surface of the land section protrudes from a surface of the adhesive layer by a predetermined amount. The tackiness between the adhesive material and the base member is lower than the tackiness between the adhesive material and the substrate.

Growing community of inventors

Hyogo, Japan

Mitsuhiro Ikeda