Yokogawa Electric Corporation

Tama-tlo Corporation

Mitsuhiro Iga

Koichi Taniguchi

Kazuhiro Watanabe

Atsushi Seki

A sensor element is used to collect environment information on a surface of the earth or a surface layer of the earth by being scattered in a target region where the environment information is collected. At least one of reflection properties, transmission properties, absorption properties, or luminescence properties with respective to an electromagnetic wave with a specific wavelength, or light emitting properties changes in accordance with an environment.

Sensor element and packaged body

An environment information collecting system collects environment information on a surface of the earth or a surface layer of the earth. The environment information collecting system includes a sensor element which is scattered in a target region where the environment information is collected, of which at least one of reflection properties, transmission properties, absorption properties, or luminescence properties with respective to an electromagnetic wave with a specific wavelength, or light emitting properties changes in accordance with an environment, and an aircraft configured to receive the electromagnetic wave obtained from the sensor element and configured to collect the environment information in the target region.

Environment information collecting system and aircraft

A microscope spectrometer in which, when an excitation light from a light source illuminates a sample, a light emitted from the sample that enters a microscope is analyzed, may include: a first optical means that forms the light emitted from the sample as a parallel beam; a first variable bandpass filter means having a variable wavelength passband that transmits incident light, which of the parallel beam of incident light, is light of a pre-established wavelength passband; a two-dimensional array light detection means that images the light in the wavelength passband; and a control means that controls the timing of the imaging by the two-dimensional array light detection means and, in accordance with the timing, changes the wavelength passband of the first variable bandpass filter means.

Microscope spectrometer, optical axis shift correction device, spectroscope and microscope using same

An optical fiber sensor enabling simpler detection of a state of an external environment and a measuring apparatus using the same are provided. At a front end of an optical fiber portionfor transmitting the light a hetero core having a different diameter from that of a core of the optical fiber portionis melt bonded so as to form a tip type optical fiber sensorhaving a sensor portioncomprised of the hetero core on its front end. An end of the optical fiber portionside of this tip type optical fiber sensorhas a light sourceconnected to it. Returned light striking the optical fiber portionfrom the light sourceand subjected to interaction with a measurement medium MD at the sensor portionis split by an optical fiber couplerand received at a photodiode or spectrum analyzer, thereby an optical fiber sensor measuring apparatusis constructed.

Growing community of inventors

Tokyo, Japan

Mitsuhiro Iga