Matsushita Electric Industrial Co., Ltd.

Nuvoton Technology Corporation Japan

Panasonic Intellectual Property Management Co., Ltd.

Panasonic Corporation

Panasonic Semiconductor Solutions Co., Ltd.

Miraxia Edge Technology Corporation

Mitsuhiko Otani

Haruka Takano

Shinichi Ogita

Junichi Matsuo

Toshiya Fujii

Kouji Yamaguchi

Naohisa Hatani

Keiichi Mori

Norihide Kinugasa

Kazutoshi Onozawa

Kazuo Matsukawa

Shinzo Koyama

Seiji Nakamura

Shigeru Saitou

Takayasu Kito

Toshiaki Ozeki

Mayu Ogawa

Takumi Kato

Takuya Asano

Yoshitsugu Inagaki

Makoto Kawamura

Makoto Yarino

Yuki Minami

Tomohito Nagata

Nobutaka Nakamae

Junji Tokumoto

Takayasu Kitou

Katsumi Hironaka

Wataru Matsumoto

A ranging device includes: a pulse generator; a controller that controls the pulse generator according to n (n is an integer greater than or equal to 4) types of packet generation codes indicating whether or not to expose or emit light in each of unit segments corresponding to distance segments into which a ranging range is divided; a light source; a solid-state image capturer; and a distance calculator that calculates the distance based on n types of signal values per unit segment obtained from the solid-state image capturer.

Ranging device and ranging method

A distance-measuring imaging device includes: a timing controller that outputs one or more timing signals; a light receiver that receives reflected light that is light emitted by a light source and reflected by a subject; a phase adjustment circuit that outputs at least one signal out of a light emission control signal and an exposure control signal, based on the one or more timing signals, the light emission control signal being used for causing the light source to emit light to the subject, the exposure control signal being used for causing the light receiver to start exposure. The phase adjustment circuit includes one or more DLL circuits each of which determines, for at least one of the one or more timing signals, at least one of a phase of a rising edge or a phase of a falling edge of the at least one signal.

Distance-measuring imaging device

A distance-measuring imaging device includes: a controller which repeatedly performs outputting of an emission signal instructing light emission and outputting of an exposure signal instructing exposure; a light source unit which performs light emission a plurality of times in accordance with the emission signal repeatedly outputted by the controller; and an imaging unit which includes a solid-state imaging element for performing exposure a plurality of times in accordance with the exposure signal repeatedly outputted by the controller and which generates an imaging signal through the exposure performed the plurality of times.

Distance-measuring imaging device and solid-state imaging element

An imaging apparatus includes a light emitter, a pixel section, and a signal processor which calculates distance information of a subject. The pixel section includes a photoelectric converter, first and second read-out gates, and a plurality of charge accumulators including a first charge accumulator and a second charge accumulator. The first read-out gate is activated in a first period and deactivated in a second period. The second read-out gate is activated in the first period and the second period. The signal processor calculates the distance information based on a total amount of signal charges accumulated in the charge accumulators in the first period and the second period and a difference between an amount of signal charges accumulated in the second charge accumulator in the first period and the second period and an amount of the signal charge accumulated in the first charge accumulator in the first period.

Imaging apparatus and distance information calculation method

A distance-measuring imaging device includes a light source that applies light according to timing of a light emission signal; a solid-state imager that performs, for an object, exposure according to timing of an exposure signal, and generates raw data corresponding to an exposure amount of the exposure; a signal amount comparator that determines a magnitude relationship in signal amount in the raw data; and a distance calculator that generates and outputs a distance signal based on a determination result. The solid-state imager accumulates, in each of different signal accumulation regions for accumulating signals detected in a same pixel, a signal by exposure in an exposure period that differs in exposure signal timing. The signal amount comparator determines the magnitude relationship between the signals accumulated in the signal accumulation regions. The distance calculator calculates the distance to the object using an arithmetic expression selected depending on the determination result.

Distance-measuring imaging device, distance measuring method of distance-measuring imaging device, and solid-state imaging device

An imaging device includes: a light source emitting light based on a first pulse; a solid-state imaging element including pixel units and exposing the light based on a second pulse; and a signal processor. Each pixel unit includes a photoelectric converter and charge accumulating units, and generates first to third signal charges by first to third exposure processes in this order to be accumulated in the charge accumulating units. Each of the first and third exposure processes is based on the second pulse delayed from the first pulse by a first period, and the second exposure process is based on the second pulse delayed from the first pulse by a second period. A total period of the first and third exposure processes is equal to that of the second exposure process. The signal processor calculates a distance signal for each pixel unit by using the first to third signal charges.

Imaging device and solid-state imaging element and imaging method used therein

In a distance measuring device, a drive controller generates an emission timing signal and an exposure timing signal in accordance with a measurement condition. A light source irradiates light in response to the emission timing signal. A solid-state image sensor has a group of pixels arranged in a matrix pattern and divided into a plurality of regions on a line-by-line basis, and performs an exposure process on a selected one of the regions in response to the exposure timing signal. An imaging signal processor obtains distance information by performing an arithmetic operation on a signal output from the solid-state image sensor. The drive controller generates mutually different measurement conditions to the plurality of the regions of the solid-state image sensor.

Distance measuring device and solid-state image sensor

A distance-measuring/imaging apparatus having a high S/N and a high distance measurement accuracy is provided. The distance-measuring/imaging apparatus includes: a signal generation unit for generating an emission signal and exposure signal; a light source unit for performing light irradiation by receiving the emission signal; an imaging unit for performing exposure by receiving the exposure signal and for acquiring the exposure amount of the reflected light; and a calculation unit for calculating and outputting the distance information on the basis of the exposure amount. The imaging unit acquires a first exposure amount corresponding to the exposure in a first emission/exposure period, in which the exposure is performed by receiving the exposure signal simultaneously with a receiving timing of the emission signal. The imaging unit acquires a second exposure amount corresponding to the exposure in a second emission/exposure period, in which the exposure is performed by receiving the exposure signal after a lapse of a delay time from the receiving timing of the emission signal. The calculation unit calculates the distance information on the basis of the first exposure amount and second exposure amount that are acquired by changing the repeat count of the emission signal in the first emission/exposure period.

Distance-measuring/imaging apparatus, distance measuring method of the same, and solid imaging element

A distance-measuring imaging device includes: a drive control unit; a light source unit; an image processing unit including light receiving units and charge reading units arranged one-to-one; and an image processing unit. The charge reading units are arranged partly at the left side of corresponding ones of the light receiving units and partly at the right side of corresponding ones of the same. In each of a period in which the exposure is performed when the exposure control signal is received after a first delay time since when the light emission control signal is received and a period in which the exposure is performed when the exposure control signal is received after a second delay time longer than the first delay time, since when the light emission control signal is received, the left-side charge reading units read charge leftward, and the right-side charge reading units read charge rightward.

Distance-measuring imaging device and solid state imaging element

An imaging apparatus includes: an optical lens; light receiving units each reading a photoelectric conversion signal; microlenses each placed for every two or more of the adjacent light receiving units; a signal generating unit generating (i) a full-addition signal by adding all of the photoelectric conversion signals obtained in a predetermined frame by the two or more adjacent light receiving units, (ii) a partial addition signal by adding the photoelectric conversion signals obtained by at least one but not all of the two or more adjacent light receiving units, and (iii) non-addition independent signals that are the photoelectric conversion signals of one of the light receiving units; a phase difference detecting unit detecting a focal point from the partial addition signal and the non-addition independent signals; and a camera YC processing unit generating a main image from the full-addition signal.

Imaging apparatus and solid-state imaging device

A variable delay circuit successively delays an input clock to generate a plurality of delayed clocks having different phases. A phase comparison circuit receives a first reference clock, which is either one of the delayed clocks or the input clock, and a second reference clock, which is one of the delayed clocks and whose phase lags behind that of the first reference clock, specifies a validated interval for the second reference clock, and compares the phases of the first and second reference clocks according to voltage levels of the first and second reference clocks only during the validated interval. A delay control circuit controls a delay time in the variable delay circuit according to a result of the comparison obtained by the phase comparison circuit.

DLL circuit, imaging device, and memory device

A front-end signal processing circuit that stabilizes a black level of an output signal of an image sensor in a prescribed set level, without being influenced by a DC offset component of circuit elements making up a feedback loop, and an imaging device including such the front-end signal processing circuit, are provided. The front-end signal processing circuit includes a feedback loop made up of a luminance detecting/digitizing section and a black level clamp section, and clamps a black level of an output signal of an image sensor to a prescribed set level. The front-end signal processing circuit further includes an offset correction section. The offset correction section stores an offset value being a difference between a signal level of an OB region of the image sensor and the prescribed level, subtracts the offset value from a digital luminance signal corresponding to an effective pixel region of the image sensor, and outputs the obtained signal.

Front-end signal processing circuit and imaging device

The present invention provides a pipeline A/D converter having resolution, allowable conversion processing rate and power consumption satisfying the requests of a system incorporating the pipeline A/D converter. The pipeline A/D converter in accordance with the present invention comprises a control section for outputting a control signal according to the operation state of an apparatus incorporating the pipeline A/D converter, and a pipeline A/D conversion section, the resolution and/or allowable conversion processing rate of which are switched by switching the capacitance in a built-in operational amplifier according to the control signal.

Pipeline A/D converter

An analog circuit includes a pulse control circuit for outputting pulse signals for operating component circuits based on reference pulse signals for driving an image sensor, a noise reduction circuit that is operated in accordance with a pulse signal of a horizontal drive frequency output from the pulse control circuit to reduce noise present in image signals output from the image sensor, a gain variable amplifier for adjusting an amplitude of signals output by the noise reduction circuit, an AD converter for converting the output signals of the gain variable amplifier into digital signals and output these digital signals, a clamp circuit that is operated in accordance with a pulse signal at a horizontal drive frequency output from the pulse control circuit to perform feedback control of the digital signals output by the AD converter, and a frequency-dependent bias circuit that supplies a current amount corresponding to the frequency of at least one kind of pulse signal from among the reference pulse signals and the pulse signals that are output from the pulse control circuit. The analog circuit is operated at a sufficient current amount required for the processing of signals from various image sensors having different horizontal drive frequency specifications.

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Hyogo, Japan

Mitsuhiko Otani