Kyodo Kumiai Joint-Labo Sendai

Mitsuharu Watanabe

Kenichi Arai

Shin Yabukami

Masahiro Yamaguchi

Yukio Sakurada

Takashi Tamogami

Noboru Saito

Kiichi Itagaki

Hiroshi Takahashi

Atsushi Itagaki

Koichi Fuda

A first substrate having a first electromagnetic noise sensor on its surface perpendicularly intersects with a second substrate having a second electromagnetic noise sensor on its surface, making up an integral structure. A first induced voltage value output from the first electromagnetic sensor at a position thereof directly before driving by a driving means is recorded, and a second induced voltage value output from the second electromagnetic noise sensor at a position thereof at a time of movement of the integral structure for only a predetermined distance by a driving means is recorded. Further, the first and second electromagnetic noise sensors are parallel connected at the position of movement, and a third induced voltage value output from a parallel connected electromagnetic noise sensor is also recorded. Based on the recorded first and second voltage values, an electromagnetic noise level in a vicinity of the integral substrate is determined. The first and second induced voltage values are compared, and based on comparison of the first and second induced voltage values, and whether a larger voltage value from among the first and second voltage values is larger than the third voltage value, a direction of an electromagnetic noise generating source in the vicinity of the integral substrate is computationally determined. The determined electromagnetic noise level and direction of the electromagnetic noise generating source are displayed at a position on a display device corresponding with a position of the first electromagnetic noise sensor.

Electromagnetic noise measurement apparatus

Growing community of inventors

Sendai, Japan

Mitsuharu Watanabe