Adv Antest Corporation

Electro Scientific Industries, Inc.

Sym-tek Systems, Inc.

Mitsuaki Tani

Thomas E Toth

Kazuyuki Tsurishima

Steven David Swendrowski

Mark W Klug

Douglas John Garcia

Vernon P Cooke

Malcolm Vincent Hawkes

Jeffrey L Fish

Minoru Baba

Teruaki Sakurada

Evart David Shealey

Martin J Twite, Iii

Theodore C Guenther

Martin S Voshell

Stephen R Lamb

Martin Twite

Hsang Wang

One or more concentric rings of component seats are rotatable about the rings' center. The seats are uniformly angularly spaced and the rings are incrementally rotated, the increment of rotation being the angular space between adjacent seats. The rings are inclined at an angle and a stream of components is poured onto the rings as they are rotating. Stationary fences adjacent to outboard sides of the seats, confine unseated components to tumble randomly, due to gravity, over empty seats passing through arcs of the rings' rotation paths. The random tumbling results in seated components. In the paths of the rotating rings are electrical contactors for coupling the components to a tester. Preferably there are five contactor stations to permit five different kinds of tests to be performed simultaneously. Tested components pass beneath an ejection manifold which defines a plurality of ejection holes which register with a set of seats each time the ring is rotated an increment. Ejection tubes are coupled to the ejection holes. The components are ejected from their seats by blasts of air from selectively actuated, respective pneumatic valves. Due to the blast of air and gravity, the ejected components travel down the tubes and are directed into sorting bins according to a tube routing plate. The stream of components can be selectively directed to each fence in response to a signal from a detector indicating that the fence is deprived of components. Sensors detect seated components that were not ejected by the ejection manifold.

Electrical circuit component handler

An integrated circuit (IC) device test handler which is adaptable to receive various customer tray configurations and automatically test the ICs within. The test handler comprises a customer tray magazine input area, a load section, a soak chamber, a test section, an unsoak chamber and an unload area. Two magazines containing customer trays with IC devices are input to the handler. An elevator mechanism raises the customer trays within one magazine at a time to a position which can be accessed by the loader of the test handler. A catcher device moves the trays to a buffer platform where the trays can be accessed by a transfer arm. The transfer arms moves the customer trays to one of two load stages. A pick and place apparatus removes the IC devices from each customer tray on the load stages and transfers them to a precisor for alignment and then to a test tray. The test trays are conveyed through a soak chamber to simulate certain environmental conditions and then through a double test head chamber where the IC devices are tested. The test trays are returned to ambient conditions through an unsoak chamber. A pair of unload pick and place apparatus move tested IC devices from the test trays to customer trays waiting on unload stages. The transfer arm moves the customer trays to various tray magazines based on the test results. Elevators under the magazines step down as each full customer tray is placed thereon.

Apparatus for automatic handling

A loader and unloader is disclosed which is utilized in conjunction with an automatic test machine for handling electric devices such as integrated circuits ('ICs'), semiconductor chips, and the like. The loader handles trays containing a number of ICs to be tested and transfers them to a location on the handler where the ICs can be accurately and quickly removed from the trays for testing. Following the testing, the unloader of the present invention handles the trays which receive the ICs in accordance with various sort categories depending upon the test results. The present invention also encompasses a dual receptacle transfer arm which shuttles IC trays between and among the various components of the loader and unloader. These components are configured so as to minimize travel distance and handling time, thereby increasing the productivity of an automatic test handler into which the present loader and unloader may be incorporated.

Loader and unloader for test handler

A separation and transfer apparatus for use in an electronic test system for testing electronic devices such as IC's, and the like. The apparatus has a housing for holding in a horizontal position, a magazine containing such electronic devices, an air blower for blowing compressed air at the electronic devices at an angle through a slit of the magazine so that the electronic devices are separated from one another and urged in a desired direction, a piston pin for insertion into a space developed between the last electronic device in the magazine and one end of the magazine, an advancing apparatus for changing the horizontal position of the air blower and the piston pin and for expelling the electronic devices from the magazine, and a controller for controlling the timing of the air blowing, the movement of the advancing apparatus, and the operation of the piston pin. The invention also includes a transfer apparatus having mounted thereon a second air blower and piston pin for transferring the electronic devices thus expelled from the magazine to the next stage of the test system, such as a temperature chamber. Another aspect of the present invention is a universal electronic device magazine for use in such separation and transfer apparatus, which magazine need not be changed or varied despite differences in the shape and kinds of the electronic devices to be tested.

Separation and transfer apparatus

Growing community of inventors

Saitama, Japan

Mitsuaki Tani