Sharp Kabushiki Kaisha Corporation

Mitsuaki Sugine

Kazuhiro Watanabe

Yuichiro Ohta

Yuuichi Kubo

Masaru Kitano

In the manufacturing method of the array substrate, an under layer having a surface with irregular irregularities is formed on a substrate, a metal film with irregularities profiling the surface of the under layer is formed on the under layer, a colored resist layer is formed on the metal film, the colored resist layer is patterned to form a regularly arranged colored resist pattern, an optical inspection is performed to optically detect a defect of the colored resist pattern, a defect of the colored resist pattern detected by the optical inspection is repaired; and the metal film is etched while using the resist pattern as a mask.

Manufacturing method of array substrate and manufacturing method of liquid crystal display device using the same

The invention relates to a method of production control and a method of manufacturing industrial products. It is an object of the invention to provide a method of production control and a method of manufacturing industrial products which make it possible to set a target processing quantity of a process appropriately set and to improve the throughput of a production line as a whole. A method of production control for a production line including a plurality of processes is provided, in which a target processing quantity Lk for a process Pk is obtained from:()=0()where the processes are represented by Pn (n=1, 2, . . . , k&#x2212;1, k, . . . ) in the order of their closeness to warehousing; Nk represents a total quantity scheduled to be warehoused from a day as a starting point until after lead time Tk from the process Pk up to the warehousing passes; and SKk represents an expected cumulative quantity completed, which will contribute to the warehousing, among work in process which has passed through the process Pk.

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Kawasaki, Japan

Mitsuaki Sugine