Sumitomo Electric Industries, Limited

Sumitomo Wiring Systems, Limited

Autonetworks Technologies, Limited

Sumitomo Electric Toyama Co., Ltd.

A.l.m.t. Corporation

Misato Kusakari

Yoshihiro Nakai

Yasuyuki Otsuka

Taichiro Nishikawa

Tetsuya Kuwabara

Hayato Ooi

Yoshiyuki Takaki

Taichirou Nishikawa

Yasuyuki Ootsuka

Hiroyuki Kobayashi

Kinji Taguchi

Masanobu Yoshimura

Jun Yoshimoto

Masashi Kimura

Shinichi Kitamura

Kotaro Maeda

Hiroaki Takai

Akiko Inoue

Toshiya Ikeda

Fumitoshi Imasato

Isao Iwayama

Kensuke Yamada

Tetsuya Kuwahara

An aluminum alloy wire composed of an aluminum alloy, wherein the aluminum alloy contains more than or equal to 0.03 mass % and less than or equal to 1.5 mass % of Mg, more than or equal to 0.02 mass % and less than or equal to 2.0 mass % of Si, and a remainder of Al and an inevitable impurity, Mg/Si being more than or equal to 0.5 and less than or equal to 3.5 in mass ratio, and the aluminum alloy wire has a dynamic friction coefficient of less than or equal to 0.8.

Aluminum alloy wire, aluminum alloy strand wire, covered electrical wire, and terminal-equipped electrical wire

An aluminum alloy contains at least 0.03 mass % and at most 1.5 mass % of Mg, at least 0.02 mass % and at most 2.0 mass % of Si, and a remainder composed of Al and an inevitable impurity, a mass ratio Mg/Si being not lower than 0.5 and not higher than 3.5. In a transverse section of the aluminum alloy wire, a rectangular surface-layer void measurement region having a short side of 30 &#x3bc;m long and a long side of 50 &#x3bc;m long is taken from a surface-layer region extending by up to 30 &#x3bc;m in a direction of depth from a surface of the aluminum alloy wire. A total cross-sectional area of voids present in the surface-layer void measurement region is not greater than 2 &#x3bc;m.

An aluminum alloy contains equal to or more than 0.005 mass % and equal to or less than 2.2 mass % of Fe, and a remainder of Al and an inevitable impurity. In a transverse section of the aluminum alloy wire, a surface-layer void measurement region in a shape of a rectangle having a short side length of 30 &#x3bc;m and a long side length of 50 &#x3bc;m is defined within a surface layer region extending from a surface of the aluminum alloy wire by 30 &#x3bc;m in a depth direction, and a total cross-sectional area of voids in the surface-layer void measurement region is equal to or less than 2 &#x3bc;m.

A method for producing an aluminum wire that has high strength and high conductivity even when reduced in diameter while having excellent elongation and improved in productivity. A method for producing an aluminum wire includes a solution step of subjecting a heat-treatable aluminum alloy material to a solution treatment, a wire-drawing step of subjecting the solution-treated aluminum alloy material to wire-drawing processing, a softening step of subjecting the wire-drawing processed aluminum alloy material to a softening treatment in a short time within 10 seconds, and an aging step of subjecting the softening-treated aluminum alloy material to an aging treatment.

Method for producing aluminum wire

An aluminum alloy wire composed of an aluminum alloy, wherein the aluminum alloy contains more than or equal to 0.005 mass % and less than or equal to 2.2 mass % of Fe and a remainder of Al and an inevitable impurity, and the aluminum alloy wire has a dynamic friction coefficient of less than or equal to 0.8.

An aluminum alloy wire is composed of an aluminum alloy. The aluminum alloy contains equal to or more than 0.005 mass % and equal to or less than 2.2 mass % of Fe, and a remainder of Al and an inevitable impurity. In a transverse section of the aluminum alloy wire, a surface-layer crystallization measurement region in a shape of a rectangle having a short side length of 50 &#x3bc;m and a long side length of 75 &#x3bc;m is defined within a surface layer region extending from a surface of the aluminum alloy wire by 50 &#x3bc;m in a depth direction, and an average area of crystallized materials in the surface-layer crystallization measurement region is equal to or more than 0.05 &#x3bc;mand equal to or less than 3 &#x3bc;m.

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Osaka, Japan

Misato Kusakari