Mitsubishi Heavy Industries Limited

National Institute of Advanced Industrial Science and Technology

Misaki Fukuyama

Takahiro Miyamoto

Tomoyuki Onishi

Takeshi Kaneko

Toshiya Watanabe

Ryuichi Narita

Akio Kondou

Nobuhiro Higuchi

Akio Kondo

Takayuki Numata

Natsuse Morimoto

A laser light profile measuring device of the present disclosure includes a reflection attenuation part reflecting and attenuating at least part of laser light incident from a first direction in a direction different from the first direction to generate measurement target laser light traveling in the first direction, a capture unit placed on one side of the reflection attenuation part in the first direction and which captures the measurement target laser light, a cooling body covering at least part of the reflection attenuation part and the capture unit in a circumferential direction with respect to the first direction, a refrigerant supply unit forcibly feeding a refrigerant toward the cooling body, and a rotation support part supporting the reflection attenuation part, the cooling body, and the refrigerant supply unit to be rotatable around a rotation axis extending in a horizontal direction.

Laser light profile measuring device and laser light profile measuring method

A defect detection method includes: a step of irradiating an object with a pulsed laser beam to continuously generate ultrasonic waves in the object; and a step of detecting the presence or absence of an internal defect of the object on the basis of the presence or absence of resonance of the ultrasonic waves occurring between a surface of the object and the internal defect. In this method, the internal defect is detected on the basis of the presence or absence of resonance of the ultrasonic waves occurring between the surface of the object and the internal defect. The internal defect can be thus detected even when the internal defect is in a surface layer of the object. The detected internal defect is crack or void.

Defect detection method, defect detection device, and additive manufacturing device

A clearance measurement device is a device for measuring a clearance between an inner peripheral surface of a casing and an outer peripheral surface of a rotary body. This device: emits light having a first wavelength and a second wavelength, respectively, towards the outer peripheral surface of the rotary body; receives the light reflected from the outer peripheral surface via a first filter having a transmission band corresponding to the first wavelength and via a second filter having a transmission band corresponding to the second wavelength; and measures the clearance based on a time difference of the moment to detect the rotary body.

Clearance measurement device, clearance measurement sensor, and clearance measurement method

A clearance measurement device is for measuring a clearance between an inner peripheral surface of a cylindrical casing and an outer peripheral surface of a rotating member configured to rotate in the casing. The clearance measurement device includes a marker provided to the outer peripheral surface; an optical sensor attached to the casing, and configured to emit light toward the outer peripheral surface, receive light reflected from the rotating member, and detect the marker based on a change in amount of the received reflected light; and a measurement controller configured to perform signal processing on signals from the sensor. The sensor includes light reception fibers disposed such that optical axes intersect and having a measurement region on the outer peripheral surface, and planar light sources provided in a row along a rotating direction and each configured to emit light in a manner overlapping with the measurement region.

Clearance measurement device and clearance control system

Growing community of inventors

Tokyo, Japan

Misaki Fukuyama