Mitsubishi Electric Corporation

Misa Nozuki

Shinsuke Miki

An abnormality diagnosis method for diagnosing an abnormality in operational state of a diagnosis subject includes creating a unit space from normal operation data of the diagnosis subject, the unit space serving as a reference for determining the operational state of the diagnosis subject, acquiring data having state quantities of a plurality of evaluation items from the diagnosis subject, calculating a Mahalanobis distance of the data acquired, using the unit space created, and determining an abnormality in the operational state of the diagnosis subject based on the Mahalanobis distance calculated. The creating a unit space includes creating a plurality of unit spaces having mutually different data lengths The calculating a Mahalanobis distance includes calculating a plurality of Mahalanobis distances using the plurality of unit spaces created. The determining an abnormality includes determining an abnormality based on the plurality of Mahalanobis distances calculated.

Abnormality diagnosis method, abnormality diagnosis device and non-transitory computer readable storage medium

An abnormality diagnosis method for diagnosing an abnormality in equipment includes acquiring multivariate time-series data for a plurality of measurement items from the equipment, diagnosing an abnormality in operational state of the equipment based on the multivariate time-series data, and diagnosing a cause of the abnormality. The diagnosing a cause of the abnormality includes extracting a feature of a first section before the occurrence of the abnormality from the multivariate time-series data of the first section, extracting a feature of a second section after the occurrence of the abnormality from the multivariate time-series data of the second section, obtaining an amount of change in feature from a difference between the feature of the first section and the feature of the second section, and diagnosing a measurement item that is the cause of the abnormality based on the amounts of change in features of the plurality of measurement items.

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Tokyo, Japan

Misa Nozuki