Electronics and Telecommunications Research Institute

Korea Advanced Institute of Science and Technology

Samsung Electronics Co., Ltd.

Miran Park

O-Kyun Kwon

Won Seok Han

Namje Kim

Shinmo An

Seungryong Cho

Tae-Soo Kim

Hoyeon Lee

Young Hun Sung

Jae Hak Lee

Jiyoung Choi

Changhwan Kim

Disclosed are a method, an apparatus, and a system for inspecting a ball grid array-type semiconductor chip package. A first embodiment of the present invention provides an apparatus for inspecting a semiconductor chip package, the apparatus comprising: a first image acquisition unit for acquiring a reference image using a three-dimensional image of a semiconductor chip serving as a reference, the reference image being obtained by removing a region of interest from the three-dimensional image; a second image acquisition unit for acquiring a two-dimensional image of a semiconductor chip to be inspected; and an image processing unit for deriving an image of a region of interest of the semiconductor chip to be inspected, from the difference between the reference image and the two-dimensional image.

Method for inspecting ball grid array-type semiconductor chip package

Provided is a quarter-wavelength shifted distributed feedback laser diode. The laser diode includes a substrate having a laser diode section and a phase adjustment section, a waveguide layer on the substrate, a clad layer on the waveguide layer, a grating disposed in the clad layer in the laser diode section, an anti-reflection coating disposed on one side walls, of the substrate, the waveguide layer, and the clad layer, adjacent to the laser diode section, and a high reflection coating disposed on the other side walls, of the substrate, the waveguide layer, and the clad layer, adjacent to the phase adjustment section.

High-output power quarter-wavelength shifted distributed feedback laser diode

Provided is a tunable semiconductor laser including an active gain region in which an optical signal is generated according to a modulation signal, a mode control region in which a resonant mode is controlled according to a mode control signal, and a signal chirp of the optical signal is compensated according to a first compensation signal determined based on the modulation signal, and a distributed Bragg reflector (DBR) region in which an oscillation wavelength of the optical signal is determined based on a wavelength selection signal for the optical signal, a second compensation signal for compensating for a thermal chirp of the optical signal on a basis of the modulation signal, and a heater signal provided to a heater electrode.

Tunable semiconductor laser and operation method thereof

An optical signal generating apparatus according to an embodiment of the inventive concept includes a first optical intensity modulator for modulating a first optical signal to generate a 2-level (where N is a positive integer) second optical signal in the form of a binary signal, a first optical amplifier for amplifying the second optical signal to generate a third optical signal, and a second optical intensity modulator for modulating the third optical signal to generate a 2-level fourth optical signal in the form of a binary signal. The optical signal generating apparatus according to an embodiment of the inventive concept may generate a low-cost, high-quality optical signal by using an optical device to generate a multi-level optical signal. Additionally, the optical signal generating apparatus according to an embodiment of the inventive concept may generate a multi-level optical signal by sequentially performing optical modulation and optical amplification operations.

Optical signal generating apparatus and operating method thereof

Disclosed herein are an X-ray imaging apparatus and a method for the same. The X-ray imaging apparatus includes a kernel function setter configured to set a scatter kernel function in response to a scatter component included in first X-ray image data detected by an X-ray detector, and an image data corrector configured to generate second X-ray image data obtained by performing scatter correction on the first X-ray image data using the scatter kernel function and data consistency. According to the X-ray imaging apparatus and the control method for the same, scatter correction is performed by using data consistency so that accuracy of the scatter correction may be increased and an X-ray image may be generated based on the accuracy, thereby improving quality of the X-ray image.

X-ray imaging apparatus and control method for the same

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Daejeon, South Korea

Miran Park