Asml Netherlands B.v.

Mir Homayoun Shahrjerdy

Arie Jeffrey Den Boef

Paul Christiaan Hinnen

Thomas Theeuwes

Anagnostis Tsiatmas

Shu-jin Wang

Maria Isabel De La Fuente Valentin

Elliott Gerard McNamara

Hans Van Der Laan

Elliott Gerard Mc Namara

A method including: obtaining a detected representation of radiation redirected by each of a plurality of structures from a substrate additionally having a device pattern thereon, wherein each structure has an intentional different physical configuration of the respective structure than the respective nominal physical configuration of the respective structure, wherein each structure has geometric symmetry at the respective nominal physical configuration, wherein the intentional different physical configuration of the structure causes an asymmetric optical characteristic distribution and wherein a patterning process parameter measures change in the physical configuration; and determining a value, based on the detected representations and based on the intentional different physical configurations, to setup, monitor or correct a measurement recipe for determining the patterning process parameter.

Method and apparatus to determine a patterning process parameter

A method including computing, in accordance with one or more parameters of a substrate measurement recipe, measurement with a latent image of a target and measurement with a post-development image corresponding to the latent image, to evaluate a characteristic determined from the computed measurement with the latent image of the target and determined from the computed measurement with the post-development image corresponding to the latent image; and adjusting the one or more parameters of the substrate measurement recipe and re-performing the computing, until a certain termination condition is satisfied with respect to the characteristic.

Substrate measurement recipe design of, or for, a target including a latent image

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Eindhoven, Netherlands

Mir Homayoun Shahrjerdy