Nanophoton Corporation

Panasonic Corporation

Osaka University

Minoru Kobayashi

Taisuke Ota

Satoshi Kawata

Shogo Kawano

Hiroshi Watanabe

Tomio Shiota

Katsumasa Fujita

Keiji Uchida

Naoyoshi Kubota

Takahiro Ode

Osamu Nakamura

Kazuya Kikuchi

Shin Mizukami

Tomoya Uchiyama

Naoko Nakamura, Legal Representative

Shunichiro Matsuzaka

Yusuke Shiozaki

Shota Yamauchi

Naoko Nakamura

An optical microscope according to one aspect of the present disclosure includes: a light source; a first scanner to scan a spot position of a light beam on a sample; an objective lens to focus the light beam deflected by the first scanner and cause the light beam to be made incident on the sample; a spectroscope including a slit on an incident side which an outgoing light emitted from an area on the sample onto which the light beam has been illuminated enters; a detector configured to detect an outgoing light from the spectroscope; and a first relay optical system including a first off-axis parabolic mirror that is arranged in an optical path from the first scanner to the objective lens and reflects the light beam deflected by the first scanner and a second off-axis parabolic mirror that reflects the light beam reflected in the first off-axis parabolic mirror.

Optical microscope and spectroscopic measurement method

An objective lens according to an aspect of the present disclosure includes a first element having a first surface to a fourth surface and a second element having a first planar surface and a second planar surface and being located on the specimen-side of the first element. The first surface is a transmissive planar surface located on the optical axis, the second surface is a reflective convex surface located on the optical axis, the third surface is a reflective concave surface located on the outer side of the first surface, and the fourth surface is a transmissive planar surface located on the outer side of the second surface. The first planar surface is a transmissive planar surface to be joined to the fourth surface and the second planar surface is a transmissive planar surface parallel to the first planar surface.

Reflective objective lens and observation method

An optical microscope capable of performing measurement with a high resolution and a spectrometry method are provided. A spectrometry device according to an aspect of the present invention includes a Y-scanning unit that scans a spot position of the light beam on the sample, a beam splitter that separates, among the light beam incident on the sample, outgoing light, the outgoing light being emitted with a different wavelength, a spectroscope that spatially disperses the outgoing light separated by the beam splitter according to the wavelength, a detector that detects the outgoing light dispersed by the spectroscope, and a pinhole arraydisposed on an incoming side of the spectroscope, a plurality of pinholes being arranged in the pinhole array, the plurality of pinholes being adapted to allow outgoing light to pass therethrough to the spectroscope side.

Optical microscope and spectrometry method

A light blocking member () for application, to a microscope is provided. Although it is producible at a sufficiently low cost, it can sufficiently block ambient light, and does not require a special operation when a sample () is placed on a stage () or the sample is taken out from above the stage. The light blocking member () is formed from a soft polymer, has an inner peripheral surface which is cylindrical in at least an upper part thereof, and is held on an objective lens assembly by fitting the upper part onto the outer peripheral surface of the objective lens assembly.

Light blocking member applicable to microscope

A touch screen () disposed on a display surface of a display means () is used as an inputting means so that a variety of actions of a microscope can be controlled with sufficient ease and precision. A variety of actions are controlled based on an operator's various finger gestures used on the touch screen disposed on the display surface of the display means, for example, making contact by a finger (tap), making two consecutive contacts by a finger (double-tap), making contact by a finger, and moving the finger without releasing it (drag), making contact by a finger and maintaining the contact for a predetermined time or longer (touch-and-hold), making simultaneous contact by two fingers, and increasing spacing between the fingers (pinch-out) or decreasing the spacing (pinch-in), and making simultaneous contact by two fingers, and moving the fingers in parallel (double-drag).

Microscope

A spectrometry device according to an aspect of the present invention is including a light source (), a lensconcentrating a light beam from the light source () on a reference sample (), an objective lens () concentrating a light beam that has passed through the first lens () on a measurement sample (), a spectroscope () dispersing light having a different wavelength from that of the light beam generated in the measurement sample () and the reference sample () by irradiation of the light beam into a spectrum, a detector () detecting light that is dispersed by the spectroscope (), and a beam splitter () separating an optical path of light from the reference sample () and the measurement sample () toward the spectroscope () from an optical path of a light beam that propagates from the light source () toward the measurement sample ().

Spectrometry device and spectrometry method

A Raman microscope and a Raman spectrometric measuring method achieve measurements with high wavenumber resolution. The Raman microscope includes a pump light source for emitting pump light as continuous light; a relaxation light source for emitting relaxation light to induce stimulated emission in a sample; a dichroic mirror for irradiating the relaxation light and the pump light to the sample; a spectrograph for spectrally separating Raman scattered light generated in the sample; and a detector for detecting the Raman scattered light spectrally separated in the spectrograph.

Raman microscope and Raman spectrometric measuring method

Provided is a nonlinear optical material, an optical recording material, an optical recording method, a photosensitive material, a photopolymerization initiator, and a photosensitizer. One exemplary aspect of the present invention is a photosensitive material used for photolithography for forming a pattern by irradiating a photoresist with excitation light which includes a donor moleculethat is excited by the excitation light, and an acceptor moleculethat is excited by energy transfer or charge transfer from the excited donor

Optical recording material, optical recording method, photosensitive material and method

An optical microscope applies laser light to a sample through the an objective lens, detects reflected light reflected by the sample through the objective lens, changes a focal position of the laser light in an optical axis direction, extracts a focal position for spectrum measurement based on a detection result of the reflected light when the focal position of the laser light is changed, adjusts the focal position to coincide with the extracted focal position, separates outgoing light exiting from the sample by application of the laser light with the adjusted focal position from the laser light, and measures a spectrum of the outgoing light separated from the laser light with a spectroscope.

Optical microscope and spectrum measuring method

A plasma display device includes a front protective cover and a back cover that form a chassis for receiving a module in which a plasma display panel is incorporated in a chassis member. The front protective cover includes a front frame having a front frame opening for exposing a front image display region of the plasma display panel, a protective plate attached to the front frame opening of the front frame, and a protective plate pressing bracket that presses the periphery of the protective plate against the edge of the front frame opening of the front frame. A reinforcing frame is disposed between the front frame and the protective plate pressing bracket.

Plasma display device

To increase spatial resolution by observing a sample based on saturated fluorescence components. A fluorescence microscope according to the present invention includes: a laser light sourceemitting laser light as excitation light; an objective lensfocusing the laser light and applying the focused laser light to a sample; a detectordetecting fluorescence generated in the samplewith the laser light; and a stagescanning the samplewhile moving the samplerelative to the laser light, wherein the laser light is applied to the sample with varying intensities such that saturation of fluorescence occurs at the maximum intensity of the laser light, and fluorescence is detected with the detector in accordance with intensity of the laser light, and the sample is observed based on the saturation components of fluorescence.

Fluorescence microscope for which a sample is observed based on the saturation components of fluorescence and fluorescence microscopy method

A plasma display device includes a plasma display panelthat has a front substrate including a plurality of display electrodes arranged thereon and a rear substrate having data electrodes arranged thereon to cross the display electrodes, the front substrate and the rear substrate facing each other so as to form a discharge space, and chassis memberthat holds plasma display panelon a front side and has a driving circuit block for driving plasma display panelon a rear side. Chassis memberhas base platethat is divided into a plurality of base metal plates, and, to which plasma display panelis attached, and metal platesandthat couple the plurality of base metal plates, andtogether.

Plasma display device including a chassis member having a plurality of divided base metal plates

An optical microscope according to a first embodiment of the present invention includes: a laser light source; a Y-directional scanning unit moving the light beam in a Y direction; an objective lens; a X-directional scanning unit moving the light beam in a X direction; a beam splitter provided in an optical path from the Y-directional scanning unit to the sample, and separating outgoing light out of the light beam incident on the sample, which exits from the sample toward the objective lens from the light beam incident on the sample from the laser light source; a spectroscope having an entrance slit extending along the Y direction and spatially dispersing the outgoing light passed through the entrance slit in accordance with a wavelength of the light; and a detector detecting the outgoing light dispersed by the spectroscope.

Growing community of inventors

Osaka, Japan

Minoru Kobayashi