Adv Antest Corporation

Sym-tek Systems, Inc.

Minoru Baba

Kazuyuki Tsurishima

Teruaki Sakurada

Theodore C Guenther

Thomas E Toth

Mitsuaki Tani

Mark W Klug

Martin Twite

An integrated circuit (IC) device test handler which is adaptable to receive various customer tray configurations and automatically test the ICs within. The test handler comprises a customer tray magazine input area, a load section, a soak chamber, a test section, an unsoak chamber and an unload area. Two magazines containing customer trays with IC devices are input to the handler. An elevator mechanism raises the customer trays within one magazine at a time to a position which can be accessed by the loader of the test handler. A catcher device moves the trays to a buffer platform where the trays can be accessed by a transfer arm. The transfer arms moves the customer trays to one of two load stages. A pick and place apparatus removes the IC devices from each customer tray on the load stages and transfers them to a precisor for alignment and then to a test tray. The test trays are conveyed through a soak chamber to simulate certain environmental conditions and then through a double test head chamber where the IC devices are tested. The test trays are returned to ambient conditions through an unsoak chamber. A pair of unload pick and place apparatus move tested IC devices from the test trays to customer trays waiting on unload stages. The transfer arm moves the customer trays to various tray magazines based on the test results. Elevators under the magazines step down as each full customer tray is placed thereon.

Apparatus for automatic handling

A pick and plate apparatus for use in an automatic test handler picks up electronic devices from one type of tray, transfer the electronic devices in a horizontal plane to another type of tray, and places the electronic devices in a predetermined position on the other tray for testing and sorting. The pick and place apparatus includes a plurality of suction inlets for picking up the electronic devices from the tray with suction power caused by a vacuum, a guide frame for slidably mounting the plurality of suction inlets in a horizontal direction, a mechanism for providing up-and-down movement to the suction inlets for picking up the electronic devices from the one tray and placing the device in the other tray, and a mechanism for adjusting the spacing of the suction inlets to compensate for the differences in spacing between one tray and another tray.

Pick and place for automatic test handler

A contact assembly for use in testing electronic devices such as integrated circuits (IC's) and the like. The contact assembly has a test fixture having a test contactor, a corresponding carrier module aligned on a test tray for positioning the electronic devices to be tested in alignment with the test fixture, and a vertical drive for driving the carrier module to meet with the test contactor. The vertical drive is provided with an individual drive for giving an additional contact force to said carrier module and said test contactor. The vertical drive further includes a lead pusher for ensuring ideal contact pressure for the leads of the electric devices with the test contactor. The carrier module is provided with a plurality of slits for separating the leads of the electric devices and inviting the test contactor.

Contact assembly for automatic test handler

Growing community of inventors

Saitama, Japan

Minoru Baba