Seiko Instruments Inc

Ablic Inc.

Sii Semiconductor Corporation

Gakkouhoujin Chikoujigakuen

Seiko Instruments Inco.

Minoru Ariyama

Tomoki Hikichi

Daisuke Muraoka

Kentaro Fukai

Manabu Fujimura

Takemasa Miura

Atsushi Igarashi

Hirokazu Yoshizawa

Toshiyuki Uchida

Ryoichi Anzai

Akira Takeda

Satoshi Machida

Yukito Kawahara

Toshiyuki Koike

Masahiro Yokomichi

Yoshihide Kanakubo

Tomohiro Oka

Masahiro Mitani

Yoshihiro Shibuya

Hironori Yano

Yusuke Ezawa

Kozo Iijima

Masashi Shiga

A zero cross detection circuit has a first comparator circuit receiving a first input signal nand a second input signal nand outputting a first comparison result, a second comparator circuit having a hysteresis, receiving the first input signal nand the second input signal n, and providing a second comparison result, and a logic circuit providing a zero cross detection signal based on the first comparison result and the second comparison result. The logic circuit provides a reverse signal to the second comparator circuit based on the first comparison result and the second comparison result.

Zero cross detection circuit and sensor device

A zero cross detection circuit has a first comparator circuit receiving a first input signal and a second input signal and outputting a first comparison result, a second comparator circuit having a hysteresis function, receiving the first input signal and the second input signal, and outputting a second comparison result, a power supply voltage detection circuit outputting a detection signal when a power supply voltage to be supplied becomes equal to or larger than a predetermined voltage, and a logic circuit outputting a zero cross detection signal based on the first comparison result, the second comparison result, and the detection signal.

Provided is a zero-crossing detection circuit capable of detecting zero-crossing with high accuracy without being influenced by noise. The zero-crossing detection circuit includes a first comparison circuit, a second comparison circuit having a hysteresis function, and a logic circuit. The first comparison circuit is configured to output a zero-crossing detection result of a first input signal and a second input signal. The second comparison circuit is configured to output a comparison result of the first input signal and the second input signal. The logic circuit includes a unit configured to determine whether to reflect the zero-crossing detection result to output of the logic circuit based on the zero-crossing detection result and the comparison result.

Zero-crossing detection circuit and sensor device

Provided are a magnetic sensor, which is capable of accurately determining abnormalities, such as disconnection and a short circuit, of wiring of a magnetic sensor device, and the magnetic sensor device. An output control circuit of the magnetic sensor includes a voltage divider circuit, which is connected to an output terminal of the magnetic sensor, and an amplifier, which is configured to control a gate voltage of a MOS transistor, which is connected to the output terminal of the magnetic sensor, so that a voltage of the voltage divider circuit and a reference voltage become equal to each other, with the result that an output voltage of the magnetic sensor is determined by the reference voltage and a voltage dividing ratio of the voltage divider circuit.

Magnetic sensor and magnetic sensor device

An output driver circuit provides an overcurrent protection function by a simple circuit configuration. The output driver circuit has a constant-current circuit, a constant-current mirror MOS transistor, and a selector circuit. The constant-current mirror MOS transistor and the output MOS transistor constitute a current mirror circuit. The gate of the output MOS transistor is controlled by a voltage based on a constant current generated by the constant-current mirror MOS transistor, thereby limiting the current flowing between the source and the drain of the output MOS transistor.

Output driver circuit

Provided is a semiconductor integrated circuit device including a fuse circuit whose area and cost are minimized by a simple circuit configuration. The fuse circuit includes a first fuse and a second fuse having substantially the same shape and different sheet resistances, which are connected in series between terminals with different potentials. In a state in which none of the fuses is cut, a potential of an output terminal is fixed to a potential of one of the terminals.

Fuse circuit and semiconductor integrated circuit device

Provided is a sensor circuit that has little possibility of being accidentally put into a test mode in response to an external input of noise or the like. The sensor circuit includes a clock generation circuit configured to output a control signal that is used to control intermittent operation to a physical quantity detection unit, and to output a sampling signal in a sleep period, a potential detection circuit configured to detect a potential at an output terminal and to output a detection signal, and a clock control circuit configured to output a mode switching signal that is a command to switch the clock generation circuit to a test mode, when a given signal pattern is detected in data that is obtained by sampling the detection signal based on the sampling signal.

Sensor circuit

Provided is a semiconductor device which is testable even with an inspection apparatus having low current drivability, and includes an output terminal which is also used as a test terminal and an output driver having high current drivability. The semiconductor device includes a plurality of voltage determination circuits connected to the output terminal of the semiconductor device, and have threshold values that are different from each other, an encoding circuit connected to the plurality of voltage determination circuits, and configured to output an encoded signal, and a mode switching circuit configured to output a mode signal to an internal circuit depending on the encoded signal and a signal from the internal circuit.

Semiconductor device

Provided is a temperature compensation circuit capable of solely and independently adjusting a temperature compensation amount. The temperature compensation circuit includes: a first temperature compensation voltage terminal connected to a node between a first resistor and a second resistor; a second temperature compensation voltage terminal connected to a node between a third resistor and a fourth resistor; a first voltage terminal formed at a node between the first resistor and the fourth resistor; a second voltage terminal formed at a node between the second resistor and the third resistor; a fifth resistor connected between a power supply terminal and the first voltage terminal; and a sixth resistor connected between a ground terminal and the second voltage terminal.

Temperature compensation circuit and sensor device

Disclosed is a current output-type detection device capable of reducing an amount of power consumption without sacrificing detection accuracy. The detection device includes: a sensor circuit; a sensor signal processing circuit that outputs a detection signal upon receiving a signal of a detection result of the sensor circuit; and a control circuit that outputs control signals to the sensor circuit and the sensor signal processing circuit and receives the detection signal from the sensor signal processing circuit, configured in that the sensor circuit and the sensor signal processing circuit operate intermittently by the control signals from the control circuit.

Detection device

To provide a comparison circuit capable of removing the influence of an offset voltage of a comparator in the comparison circuit and obtaining a highly accurate comparison determination result even at a high temperature. A comparison circuit is equipped with a comparator including a first input terminal inputted with a first input voltage through a first capacitor and inputted with a third input voltage through a third capacitor, a second input terminal inputted with a second input voltage through a second capacitor and inputted with a fourth input voltage through a fourth capacitor, and an output terminal; a first switch which has one end connected to the first input terminal and is turned ON in a sample phase to switch the voltage of the first input terminal to a voltage of the output terminal; and a second switch which has one end connected to the second input terminal and is turned ON in the sample phase to switch the voltage of the second input terminal to a reference voltage.

Comparison circuit and sensor device

To provide a magnetic sensor which is reduced in power consumption without reducing magnetism detection sensitivity of a magnetoelectric transducing element. One end of a magnetoelectric transducing element is connected to an output electrode of a constant current circuit, and the other end thereof is connected to a power supply electrode on the positive side of one or plural signal processing circuits, and the like built in a magnetic sensor, whereby a connection relation of the magnetoelectric transducing element and the signal processing circuit is configured such that they are connected in series with a voltage source.

Magnetic sensor

A comparison circuit includes a comparator having a first input terminal receiving a first input voltage through a first capacitor, and a second input terminal receiving a second input voltage through a second capacitor, and an output terminal. A first switch has one end connected to the first input terminal and is turned on in a sample phase to set a voltage of the first input terminal as a voltage of the output terminal. A second switch has one end connected to the second input terminal and is turned on in the sample phase to set a voltage of the second input terminal as a reference voltage. A third switch is turned on in a comparison phase to equalize voltages of the other end of the first switch and the other end of the second switch.

Comparison circuit

To provide a magnetic sensor circuit that outputs a desired detection pulse while preventing an erroneous detection/erroneous release pulse output when a fluctuation in a power supply voltage occurs within an operating power supply voltage range. A magnetic sensor circuit is configured to include a detection circuit that detects a fluctuation in a power supply voltage or an internal power supply voltage and so as not to latch a determination output of a comparator by a latch circuit that, on the basis of a power supply fluctuation detection signal output from the detection circuit, holds the logic of a control clock signal output from an oscillation circuit for a prescribed period of time and determines the output logic of an output terminal.

Growing community of inventors

Chiba, Japan

Minoru Ariyama