Kabushiki Kaisha Toshiba

Tohoku University

Nippon Steel Corporation

Toshiba Memory Corporation

Minoru Amano

Yoshiaki Saito

Tatsuya Kishi

Hiroaki Yoda

Shigeki Takahashi

Tomomasa Ueda

Junichi Ito

Yoshiaki Asao

Daisuke Saida

Kentaro Nakajima

Yuichi Ohsawa

Katsuya Nishiyama

Eiji Kitagawa

Chikayoshi Kamata

Yoshihisa Iwata

Tadaomi Daibou

Masayuki Sagoi

Saori Kashiwada

Naoharu Shimomura

Shinji Yuasa

Kay Yakushiji

Tadashi Kai

Masahiko Nakayama

Akio Fukushima

Hitoshi Kubota

Junichi Miyamoto

Keiji Hosotani

Masatoshi Yoshikawa

Takeshi Kajiyama

Koichiro Inomata

Sumio Ikegawa

Hisanori Aikawa

Koji Ando

Shigemi Mizukami

Terunobu Miyazaki

Taro Nagahama

Takahide Kubota

Hiroshi Imamura

Toshihiko Nagase

Masayoshi Iwayama

Kuniaki Sugiura

Jyunichi Ozeki

Megumi Yakabe

Satoshi Yanagi

Takayuki Nozaki

Hiroaki Maekawa

Kyoichi Suguro

Tazumi Nagasawa

Gaku Minamihaba

Keiko Abe

Yukiteru Matsui

Toshiro Hiraoka

Yukie Nishikawa

Katsuhiko Hoya

Masayuki Sugiura

Masako Kodera

Makoto Nagamine

Yushi Kato

Motoyuki Sato

Takao Noda

Yoshinari Kurosaki

Akiyuki Murayama

Takao Ochiai

Tomotaka Ariga

Hajime Eda

Yasuo Ashizawa

Hideshi Sato

Chiharu Nozaki

Mikio Miyata

Takashi Otsubo

Naoyuki Seriu

Syunsuke Goto

Aki Sasaki

Masashi Kawamura

Yoshishige Suzuki

According to one embodiment, a memory includes a magnetoresistive element, a reference cell, a sense amplifier comparing a first current flowing in the magnetoresistive element with a second current flowing in the reference cell, a first transistor having a first control terminal controlling a value of the first current, a second transistor having a second control terminal controlling a value of the second current, and a controller applying a first potential to the first control terminal and a second potential to the second control terminal in a first operation, and applying the first potential to the first control terminal and a third potential larger than the second potential to the second control terminal in a second operation.

Adjustable read reference voltage to reduce errors in memory devices

According to one embodiment, a magnetic memory element includes a stacked structure. The stacked structure includes a first and a second stacked member. The first stacked member includes a first and second ferromagnetic layer. A magnetic resonance frequency of the second ferromagnetic layer is a first frequency. A direction of a magnetization of the second ferromagnetic layer is settable to a direction of a first current when a magnetic field of the first frequency is applied to the first stacked member and the first current flows in the first stacked member. The direction of the magnetization of the second ferromagnetic layer does not change when the second current smaller than the first current flows in the first stacked member. The second stacked member includes a third ferromagnetic layer. A magnetization of the third ferromagnetic layer can generate a magnetic field of the first frequency by the second current.

Magnetic memory element and memory device

According to one embodiment, a magnetoresistive element includes a first magnetic layer including O and one of Co, Fe, Ni and Mn, a second magnetic layer, a nonmagnetic layer between the first and second magnetic layers, a first electrode connected to the first magnetic layer, a second electrode connected to the second magnetic layer, and a resistive layer including N between the first magnetic layer and the first electrode.

Magnetoresistive element having a magnetic layer including O

A magnetic memory according to an embodiment includes at least one MTJ element, the MTJ element including: a magnetic multilayer structure including a first magnetic layer in which a direction of magnetization is fixed, a second magnetic layer in which a direction of magnetization is changeable, and a tunnel barrier layer located between the first and second magnetic layers; a first electrode provided on a first surface of the magnetic multilayer structure; a second electrode provided on a second surface of the magnetic multilayer structure; an insulating film provided on a side surface of the magnetic multilayer structure; and a control electrode provided on the side surface of the magnetic multilayer structure with the insulating film located therebetween, a voltage being applied to the control electrode in a read operation, which increases an energy barrier for changing the magnetization of the second magnetic layer.

Magnetic memory

A magnetoresistive effect element includes a recording layer having magnetic anisotropy and a variable magnetization direction, a reference layer having magnetic anisotropy and an invariable magnetization direction, an intermediate layer between the recording layer and the reference layer, an underlayer containing scandium (Sc) and disposed on a surface side of the recording layer opposite to a surface side on which the recording layer is disposed, and a side wall layer containing an oxide of Sc and disposed on side surfaces of the recording layer and the intermediate layer.

Magnetoresistive effect element having an underlayer and a side wall layer that contain scandium

According to one embodiment, a magnetic memory device includes a first interconnect, a second interconnect, a magnetoresistive effect element having first and second terminals, the first terminal being electrically connected to the first interconnect, a diode having first and second terminals, the first terminal being electrically connected to the first terminal of the magnetoresistive effect element, the second terminal being electrically connected to the second terminal of the magnetoresistive effect element, and a transistor having source and drain terminals, one of the source and drain terminals being electrically connected to the second terminal of the magnetoresistive effect element and the second terminal of the diode, the other of the source and drain terminals being electrically connected to the second interconnect.

Magnetic memory device

A magnetoresistive element according to an embodiment includes: a first to third ferromagnetic layers, and a first nonmagnetic layer, the first and second ferromagnetic layers each having an axis of easy magnetization in a direction perpendicular to a film plane, the third ferromagnetic layer including a plurality of ferromagnetic oscillators generating rotating magnetic fields of different oscillation frequencies from one another. Spin-polarized electrons are injected into the first ferromagnetic layer and induce precession movements in the plurality of ferromagnetic oscillators of the third ferromagnetic layer by flowing a current between the first and third ferromagnetic layers, the rotating magnetic fields are generated by the precession movements and are applied to the first ferromagnetic layer, and at least one of the rotating magnetic fields assists a magnetization switching in the first ferromagnetic layer.

Magnetoresistive element and magnetic memory

A magnetic memory according to an embodiment includes: at least one memory cell comprising a magnetoresistive element as a memory element, and first and second electrodes that energize the magnetoresistive element. The magnetoresistive element includes: a first magnetic layer having a variable magnetization direction perpendicular to a film plane; a tunnel barrier layer on the first magnetic layer; and a second magnetic layer on the tunnel barrier layer, and having a fixed magnetization direction perpendicular to the film plane. The first magnetic layer including: a first region; and a second region outside the first region so as to surround the first region, and having a smaller perpendicular magnetic anisotropy energy than that of the first region. The second magnetic layer including: a third region; and a fourth region outside the third region, and having a smaller perpendicular magnetic anisotropy energy than that of the third region.

Magnetic memory and method of manufacturing the same

A magnetoresistive element according to an embodiment includes: a base layer; a first magnetic layer formed on the base layer, and including a first magnetic film having an axis of easy magnetization in a direction perpendicular to a film plane, the first magnetic film including MnGa(45&#x2266;x&#x3c;64 atomic %); a first nonmagnetic layer formed on the first magnetic layer; and a second magnetic layer formed on the first nonmagnetic layer, and including a second magnetic film having an axis of easy magnetization in a direction perpendicular to a film plane, the second magnetic film including MnGa(45&#x2266;y&#x3c;64 atomic %). The first and second magnetic layers include different Mn composition rates from each other, a magnetization direction of the first magnetic layer is changeable by a current flowing between the first magnetic layer and the second magnetic layer via the first nonmagnetic layer.

According to one embodiment, a magnetoresistive effect element includes a first magnetic film having magnetic anisotropy and an invariable magnetization direction in a direction perpendicular to a film plane, a second magnetic film having magnetic anisotropy and a variable magnetization direction in the direction perpendicular to the film plane, and a nonmagnetic film between the first magnetic film and the second magnetic film. At least one of the first and second magnetic films includes a first magnetic layer. The first magnetic layer includes a rare earth metal, a transition metal, and boron.

Magnetoresistive effect element, magnetic memory, and magnetoresistive effect element manufacturing method

A magnetic memory element includes a first stacked unit and a second stacked unit. The first stacked unit includes a first ferromagnetic layer, a second ferromagnetic layer, and a first nonmagnetic layer. The second ferromagnetic layer is stacked with the first ferromagnetic layer. The second ferromagnetic layer has a first and second portion. The first and second portion has a changeable direction of magnetization. The second portion is stacked with the first portion in a stacking direction of the first ferromagnetic layer and the second ferromagnetic layer. A magnetic resonance frequency of the second portion is lower than a magnetic resonance frequency of the first portion. The first nonmagnetic layer is provided between the first ferromagnetic layer and the second ferromagnetic layer. The second stacked unit is stacked with the first stacked unit in the stacking direction. The second stacked unit includes a third ferromagnetic layer.

Magnetic memory element and nonvolatile memory device

According to one embodiment, a magnetic memory includes a first magnetoresistive element includes a storage layer with a perpendicular and variable magnetization, a tunnel barrier layer, and a reference layer with a perpendicular and invariable magnetization, and stacked in order thereof in a first direction, and a first shift corrective layer with a perpendicular and invariable magnetization, the first shift corrective layer and the storage layer arranged in a direction intersecting with the first direction. Magnetization directions of the reference layer and the first shift corrective layer are the same.

According to one embodiment, a magnetic memory element includes a stacked body and a conductive shield. The stacked body includes first and second stacked units. The first stacked unit includes first and second ferromagnetic layers and a first nonmagnetic layer. The first ferromagnetic layer has a fixed magnetization in a first direction. A magnetization direction of the second ferromagnetic layer is variable in a second direction. The first nonmagnetic layer is provided between the first and second ferromagnetic layers. The second stacked unit includes a third ferromagnetic layer stacked with the first stacked unit in a stacking direction of the first stacked unit. A magnetization direction of the third ferromagnetic layer is variable in a third direction. The conductive shield is opposed to at least a part of a side surface of the second stacked unit. An electric potential of the conductive shield is controllable.

Magnetic memory element

Growing community of inventors

Sagamihara, Japan

Minoru Amano