Samsung Electronics Co., Ltd.

Minho Kang

Seongkwan Lee

Cheolmin Park

Bokun Choi

Jaeyung Yeo

Gajin Song

Chounjong Nam

Junhak Lim

Hyungsun Ryu

Daesung Jung

Jaemoo Choi

Jongmin Song

Younsok Choi

Hohyun Lee

Sangyoon Soh

According to an embodiment of the disclosure, an operating method of an electronic device in a wireless communication system includes: establishing a wireless communication connection for transmitting and receiving data to and from an access point in a first communication method; receiving a state detection message from the access point; identifying an internal state of the electronic device in response to the state detection message being received; and determining whether to switch a communication interface, based on the identified internal state, and the internal state includes a received signal strength indicator (RSSI) value of the wireless communication connection, information regarding whether a network switching mode of the electronic device is enabled, information regarding whether an application related to the data is enabled, and/or information regarding use of the data.

Apparatus and method for switching communication interface in wireless communication system

An image sensor test system includes a test device configured to transmit an input signal and a control signal to at least one image sensor through a probe card, and an interface board configured to map the probe card and the test device to each other. The interface board includes a signal receiver configured to receive an image signal from the at least one image sensor, amplify the image signal, and output the image signal to the test device, and the signal receiver includes an operational amplifier configured to amplify the image signal, and a low-frequency attenuator connected to an output terminal of the operational amplifier.

Image sensor test system including operational amplifier and low-frequency attenuator

Disclosed are an electronic device for controlling at least one input device and a control method thereof. An electronic device, according to an embodiment of the disclosure, may: acquire identification information of an external display device based on the electronic device being operably connected to the external display device; acquire identification information of at least one input device from the at least one input device located within a threshold proximity of the electronic device; compare the acquired identification information of the at least one input device with reference information of the input device associated with the identification information of the external display device and stored in the memory; and connect to the at least one input device based on a result of the comparison.

Electronic device for controlling at least one input device and control method thereof

A receiver, which is compatible with a mobile industry processor interface (MIPI) C-PHY physical layer, includes a plurality of variable-gain amplifiers responsive to respective multi-level signals (e.g., 3-level signals), and a plurality of filters having variable cutoff frequencies. The plurality of filters are responsive to respective signals generated by the plurality of amplifiers. An array of comparators is provided, which is responsive to signals generated by the plurality of filters. A jitter detection circuit is provided, which is configured to set respective gains of the plurality of variable-gain amplifiers and respective cutoff frequencies of the plurality of filters (e.g., high-pass filters), in response to signals generated by the array of comparators.

High performance receivers for mobile industry processor interfaces (MIPI) and methods of operating same

A measuring apparatus for a vacuum chamber capable of accurately measuring physical properties or quantities in the vacuum chamber in an exposure process in real time, and a measuring system including the measuring apparatus are described herein. The measuring apparatus includes: a body having a shape of an exposure mask used in an exposure process; and a measuring element in an interior of the body or on a first surface of the body. When the measuring apparatus is positioned in a vacuum chamber during the exposure process, the measuring apparatus is configured to measure physical properties in the vacuum chamber using the measuring element. The body or the measuring element is configured to withstand a vacuum in the vacuum chamber including resisting or preventing physical deformation of the body or the measuring element due to the vacuum.

Measuring apparatus for vacuum chamber and measuring system including the same

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Seoul, South Korea

Minho Kang