Boe Technology Group Co., Ltd.

Ordos Yuansheng Optoelectronics Co., Ltd.

Mingyang Zhang

Tao Yang

Jin Zhao

Shanshan Bao

Pucha Zhao

Hongwei Gao

Xiaopeng Bai

Xinxin Jin

Yuebai Han

Embodiments of the present disclosure provide a test circuit, a test method, a display panel and a display apparatus. Each of the signal input terminals may input a plurality of signals in a time division multiplexed manner, and in turn may be controlled by the corresponding switches to form a plurality of signal lines, a signal flow of the plurality of signal lines are totally different from each other under control of the switches. For example, one of the signal lines may function as a signal input line, and the other one of the signal lines may function as a signal input line for other specific testing, such as aging process so as to input signals different from the normal turn-on state signals. Consequently, by controlling the corresponding switches through the control signal terminals so that different input signals pass through different signal lines into the display panel to meet testing requirements of normal turn-on state testing, aging process and so on for the display panel. With respect to the prior art, the testing signals may be input without passing through a shift register unit, which avoids damage of a specific testing signal such as aging signal on the shift register unit and ensure a normal displaying function of the display panel.

Test circuit, test method, display panel and display apparatus

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Beijing, China

Mingyang Zhang