Au Optronics Corporation

Winbond Electronics Corporation

Ming-Yi Lay

Yong-Fen Hsieh

Shang-Kung Tsai

Chin-Kun Lo

Jian-Yu Liu

Metal bumps for connecting a nonconducting substrate and a chip without lateral shorting are provided. In a first preferred embodiment, an insulating layer covers the entire sidewalls of all the metal bumps. In a second preferred embodiment, predetermined portions of a first metal bump and a second metal bump are covered with an insulating layer. For example, a first predetermined portion of the sidewall of the first metal bump may be zcovered with an insulating layer, while a second predetermined portion of the sidewall of the second sidewall is also covered with an insulating layer.

Metal bump with an insulating sidewall and method of fabricating thereof

A time dependent dielectric breakdown (TDDB) test device is used for testing a dielectric layer to obtain a time to failure (TTF) data, wherein the TDDB test device is electrically connected between a power source and a current detector and the dielectric layer includes at least a first capacitor and a second capacitor formed about selected first and second locations of the dielectric layer. The device includes a first current-limiting apparatus electrically connected to the first capacitor in series, a second current-limiting apparatus electrically connected to the second capacitor in series and the first current-limiting apparatus in parallel, and a voltage-regulating apparatus electrically connected to the second current-limiting apparatus in series. It also provides a method for implementing such device.

Growing community of inventors

Hsinchu, Taiwan

Ming-Yi Lay