Macronix International Co., Ltd.

Skymedi Corporation

Ming-Hung Chou

Han-Lung Huang

Chien-Fu Huang

Shih-Keng Cho

Jen-Ren Huang

Chia-Hsing Chen

Smile Huang

Chih-Cheng Tu

Yan-Wun Huang

Chih-Hwa Chang

Hsin-Yi Ho

Ying-Che Lo

Mam-Tsung Wang

Ming-Shang Chen

Wenpin Lu

Fuja Shone

Cheng-Jye Liu

Chia-Shing Chen

Jui-Lin Lu

Chia Hsing Chen

Yi-Ching Liu

Kent Kuohua Chang

Jiunn-Ren Hwang

Wen-Pin Lu

Hsin-Huei Chen

Chong-Jen Huang

I-Long Lee

Fuh-Cheng Jong

Shou-Wei Hwang

Fu-Chia Shone

Hsin-Chien Chen

Tung-Hwang Lin

Jen-Ren Chiou

A method of sorting a multi-bit per cell non-volatile memory includes programming and reading to test an n-bit-per-cell (n-bpc) non-volatile memory, which has a plurality of m-bpc pages, where m is a positive integer from 1 through n. If the m-bpc page fails the test, counting a block associated with the failed m-bpc page to (m-1)-bpc blocks, wherein each said m-bpc page is subjected to at most one time of programming and reading. When m is equal to 1, the 0-bpc block corresponds to a bad block.

Method of sorting a multi-bit per cell non-volatile memory and a multi-mode configuration method

A method of programming a multi-bit per cell non-volatile memory is disclosed. In one embodiment, the non-volatile memory is read to obtain a first data of a most-significant-bit (MSB) page on a current word line that succeeds in data reading, wherein the current word line follows a preceding word line on which data reading fails. At least one reference voltage is set. The MSB page on the current word line is secondly programmed with a second data according to the reference voltage, the second data being different from the first data.

Method of programming a multi-bit per cell non-volatile memory

A method of programming/reading a multi-bit per cell non-volatile memory with a sequence is disclosed. A plurality of less-significant-bit pages are programmed, and a plurality of consecutive most-significant-bit pages of a plurality of consecutive word lines are programmed one after the other in a consecutive order. The most-significant-bit pages through all word lines in at least one memory block of the non-volatile memory are programmed or read after the less-significant-bit pages through all the word lines in the at least one memory block are programmed or read.

Method of programming/reading a non-volatile memory with a sequence

A method of dynamic data storage for error correction in a memory device is disclosed. Data for storage is received, the received data is encoded and error correction code (ECC) is generated. The encoded data is stored in the memory device that includes a plurality of pages each having a plurality of data partitions. More corrected errors a marked page has, a smaller portion with a space of at least one datum of each of the corresponding data partitions associated with the marked page is allocated to store the encoded data, while a size of the ECC is fixed, thereby increasing capability of correcting errors in the marked page.

Method and system of dynamic data storage for error correction in a memory device

A method of twice programming a multi-bit per cell non-volatile memory with a sequence is disclosed. At least one page at a given word line is firstly programmed with program data by a controller of the non-volatile memory, and at least one page at a word line preceding the given word line is secondly programmed with the same program data by the controller.

Method of twice programming a non-volatile flash memory with a sequence

A method of dynamic data storage for error correction in a memory device is disclosed. Data for storage is received, and the received data is then encoded and associated error correction code (ECC) is generated. The encoded data is stored in a portion of a data partition of the memory device, wherein percentage of the stored data in the data partition is determined according to an amount of corrected errors associated with the data partition or is predetermined.

A method and system for adaptively finding reference voltages for reading data from a multi-level cell (MLC) flash memory is disclosed. According to one embodiment, a first total number of cells of the flash memory above a first threshold voltage in a shifted threshold voltage distribution is provided. Search to find a second threshold voltage such that a second total number of the cells above the second threshold voltage is approximate to the first total number. An initial reference voltage or voltages of the initial threshold voltage distribution are shifted with an amount approximate to a voltage difference between the second threshold voltage and the first threshold voltage, thereby resulting in a new reference voltage or voltages for reading the data from the MLC flash memory.

Method and system for adaptively finding reference voltages for reading data from a MLC flash memory

The present invention is directed to a memory device with protection capability and a method of accessing data therein. A spreader encrypts input user data according to an entered password, and the encrypted data is then stored in a storage area. A despreader performs reverse process of the spreader on the stored data according to the entered password.

Memory device with protection capability and method of accessing data therein

A method of reducing coupling effect in a flash memory is disclosed. A neighboring page is read, and a flag is set active if the neighboring page is an interfering page. Data are read from the neighboring page at least two more times using at least two distinct read voltages respectively. The threshold-voltage distributions associated with an original page and the neighboring page are transferred according to the read data and the flag.

Method of reducing bit error rate for a flash memory

A method and system of finding a read voltage for a flash memory is disclosed. Data are read from array cells of the flash memory with a default read voltage, and a recorded state bit number that is recorded during programming is also read. Determine an optimal read voltage if the readout data do not pass the error correction control (ECC). Data are then re-read from the array cells of the flash memory with the determined optimal read voltage.

Method and system of finding a read voltage for a flash memory

A uniform coding system for a flash memory is disclosed. A statistic decision unit determines a coding word according to a plurality of inputs. An inverse unit controllably inverts input data to be encoded. The input data are then encoded into encoded data according to a statistic determined by the statistic decision unit.

Uniform coding system for a flash memory

A method and system for obtaining a reference block on which reference voltages may be found for a MLC flash memory are disclosed. A first block and a second block are provided in the flash memory. A memory controller alternatively controls one of the first and the second blocks to act as the reference block and the other one as a cycle block in a respective period, during which the reference block stays idle and the cycle block is subjected to program/erase cycles.

Method and system for obtaining a reference block for a MLC flash memory

A method and system for adaptively finding reference voltages for reading data from a multi-level cell (MLC) flash memory is disclosed. According to one embodiment, information about an initial threshold voltage distribution is firstly provided. A first threshold voltage in the initial threshold voltage distribution is then associated with a second threshold voltage in a shifted threshold voltage distribution to be determined, such that the information corresponding to the first threshold voltage is approximate to the information corresponding to the second threshold voltage. Accordingly, initial reference voltage or voltages of the initial threshold voltage distribution are shifted with an amount approximate to difference between the first threshold voltage and the second threshold voltage, thereby resulting in new reference voltage or voltages for reading the data from the MLC flash memory.

A programming method for programming stored bits in floating gates of a flash memory cell or selected flash memory cells of a flash memory array is utilized for applying SSI injection on said flash memory cell or said selected flash memory cells of a flash memory array is disclosed. Constant charges at the drain regions of said flash memory cell or said selected flash memory cells of the flash memory array is implemented with a capacitor and a related switch for suppressing variant injected-charges-related properties in applying the SSI injection. A constant biasing current, which may be implemented with a constant current source or a current mirror equipped with a constant current source, is applied on source regions of said flash memory cell or said selected flash memory cells of the flash memory array for enhancing the suppression of said variant biasing properties.

Growing community of inventors

Hsinchu, Taiwan

Ming-Hung Chou