Taiwan Semiconductor Manufacturing Comp. Ltd.

Ming-Ho Yang

Shih-Chang Chen

Ming-Fang Wang

Karen Mai

Liang-Gei Yao

Yu Min Lin

Kun-Chih Lee

Liang-Gi Yo

A method for cleaning a process chamber in such a manner that chamber-cleaning chemicals or agents are incapable of remaining in the chamber after cleaning and chemically interfering with semiconductor fabrication or other processes subsequently carried out in the chamber. The method includes providing a repellant coating layer having a hydrophobic or hydrophilic polarity on the interior surfaces of a process chamber and using a cleaning agent having a polarity opposite that of the repellant coating layer to clean the chamber. Accordingly, the cleaning agent removes post-processing chemical residues from the interior chamber walls and other surfaces and is incapable of adhering to the surfaces and remaining in the chamber upon commencement of a subsequent process carried out in the chamber.

Chamber cleaning method

A method for fabricating a portion of an integrated circuit on a semiconductor substrate. The method includes cleaning the surface of the substrate, and forming a thin insulate over the substrate. The method also includes depositing a high dielectric constant (high-k) material over the thin insulate, and then performing a hydrogen-based anneal on the high-k material. The method further includes performing an oxygen-based anneal on the high-k material, wherein the hydrogen-based and oxygen-based anneals occur sequentially.

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Chu-Bei, Taiwan

Ming-Ho Yang