Intel Corporation

Taiwan Semiconductor Manufacturing Comp. Ltd.

Ming Chieh Huang

Stefan Rusu

Kevin X Zhang

Fatih Hamzaoglu

Bing Wang

Kuoyuan Hsu

Young Suk Kim

Jonathan Shoemaker

Tsung-Yung Chang

A circuit and method for a sense amplifier for sensing the charge stored by a memory cell is disclosed. The memory cell is coupled to a bit line, a complementary bit line and a differential sense amplifier is coupled to the bit line and the complementary bit line. A control signal couples a reference voltage to the complementary bit line. A positive precharge voltage is applied to the bit line and complementary bit line prior to the sense amplifier being enabled. The memory cell outputs a voltage to the bit line responsive to a word line, and the sense amplifier senses the differential voltage between the bit line and the complementary bit line responsive to a sense enable signal. A voltage regulator for generating the reference voltage, preferably about 80% of a positive supply voltage, is disclosed. A method of sensing data stored by a memory cell is disclosed.

Circuit and method for a Vdd level memory sense amplifier

In one embodiment of the present invention, a technique is provided to control leakage of a cache sub-array. Other embodiments are disclosed herein. A sleep and shut-off circuit is connected between a virtual supply terminal and a first physical supply terminal to reduce leakage from the cache sub-array when the cache sub-array is disabled in a shut-off mode. The cache sub-array is connected between the virtual supply terminal and a second physical supply terminal. An active circuit is connected to the sleep and shut-off circuit in parallel to enable the cache sub-array in a normal mode and to disable the cache sub-array in the shut-off mode.

Cache leakage shut-off mechanism

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San Jose, CA, United States of America

Ming Chieh Huang