Via Technologies, Inc.

Ming-Cheng Tsai

Heng-Chen Ho

Te-Hung Wang

Ing-Bor Hsieh

An apparatus for joystick control circuit, used in connection with a game port that is connected to the joystick control circuit and comprises a plurality of pins addressed to a plurality of joystick buttons, comprises: a connector, an electric switch, and a latch device. The connector comprises a plurality of pinholes that corresponds to the plurality of pins of the game port addressed to the joystick buttons, and a signal pinhole, such that the apparatus is connected to the joystick control circuit through the connector. The electric switches is connected to the pinholes of the connector that are addressed to the joystick buttons to perform either a short-circuit or open circuit of the joystick button addressed pinholes. The latch device is connected to the electric switch and the signal pinhole, such that the latch device commands the electric switch when receiving a signal from the signal pinhole.

Method and apparatus for testing a joystick control circuit

A method for performing rework test on integrated circuit (IC) packages is provided. By this method, the first step is to remove a selected part of the casing of the IC package to form an opening in the casing to expose the IC chip contained in the casing. Then, an adhesive layer, such as a double adhesive tape, is attached over the casing on the side where the opening is formed. Then, a heat-insulative cover, such as a ceramic cover, is adhered to the double adhesive tape. After this, the entire IC package is mounted by solder on a test circuit board, allowing a function test procedure to be performed on the internal circuitry of the IC chip contained in the casing. During the function test procedure, when necessary, the ceramic cover can be easily and effortlessly detached to allow the test engineer to visually inspect the inside IC chip for any structural problems.

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Taipei Hsien, Taiwan

Ming-Cheng Tsai