Omnivision Technologies, Inc.

United Microelectronics Corp.

Ming-Chang Yang

Chih-Pin Jen

Sheng-Kuai Yang

Chin-pin Jen

Hung-chieh Chen

Ze-Yan Li

Juinn Lee

Wen-Kai Shih

A liquid crystal on silicon (LCOS) device includes a liquid crystal on silicon (LCOS) module with a thermal sensor disposed on a circuit board. A compensator with a rotatable device is disposed on top of the LCOS module, and a processing device is formed on the circuit board and responsive to color-specific response trend of thermal signals to control rotation angles of the compensator according to the thermal signals received from the thermal sensor.

Liquid crystal on silicon device with an adaptive compensator

A method of increasing uniformity in light from a light source at a plurality of targets of the light includes locating a plurality of movable aperture elements between the light source and the targets. Each aperture element defines an aperture through which the light passes from the light source to an associated one of the plurality of targets associated with the aperture element along a longitudinal axis of the aperture element. The method also includes moving at least one of the aperture elements along its longitudinal axis to change a feature of light incident on the target associated with the aperture element.

Image sensor testing probe card

An apparatus and method for increasing uniformity in light from a light source at a plurality of targets of the light include a plurality of movable aperture elements, locatable between the light source and the targets, each aperture element defining an aperture through which the light passes from the light source to an associated one of the plurality of targets associated with the aperture element along a longitudinal axis of the aperture element. A holder movably holds the plurality of aperture elements, each of the plurality of aperture elements being movable within the holder along the longitudinal axis of the aperture element to change a feature of light incident on the target associated with the aperture element.

Apparatus and method for obtaining uniform light source

For a plurality of logic integrated circuits, initial value vectors associated with flip-flops are retrieved from each of corresponding scan chain sets. The initial value vectors of the same corresponding scan chain set are compared with each other so as to identify elements with fixed values in the initial value vectors. When the total number of the elements with fixed values reaches a predetermined percentage, the elements having fixed values are selected as a golden pattern of the corresponding scan chain set. During the testing, an initial value vector of a scan chain of a logic integrated circuit to be tested is compared with the golden pattern associated with the scan chain, so as to determine whether a faulty flip-flop exists in the scan chain of the logic integrated circuit to be tested.

Growing community of inventors

Hsinchu, Taiwan

Ming-Chang Yang