Adv Antest Corporation

Konami Digital Entertainment Co., Ltd.

Minako Yoshida

Takahiro Yamaguchi

Takashi Watanabe

Mani Soma

Masayoshi Ichikawa

Masayoshi Suzuki

Hiroyuki Tomita

According to the game control device, game control method, game control program, storage medium and game system of this invention, when composite processing on characters is performed, consumption points that are consumed in the composite processing are subtracted from the composition points corresponding to the user's user identifying information, and when the subtraction result is negative, predetermined point addition processing is performed until the subtraction result becomes zero or more. By performing the point addition processing as described above, the game control device, game control method, game control program, storage medium and game system can improve the user's operability without requiring the reselection of other characters to be composited.

Game control device, game control method, storage medium, and game system

An electronic device having a semiconductor circuit formed therein includes a semiconductor device in which the semiconductor circuit is formed; and a light emitting device, formed integrally with the semiconductor device, for emitting light indicating a reference position of the semiconductor device.

Electronic device with integrally formed light emitting device and supporting member

A processing apparatus for processing an electronic device having a light emitting unit, includes: a light receiving unit for receiving light emitted by the light emitting unit; a position detector for detecting the position of the electronic device; and a processing unit for processing the electronic device based on the position of the electronic device detected by the position detector.

Processing apparatus, processing method and position detecting device

A method of producing a contact structure and a probe card makes it possible to test a semiconductor integrated circuit device formed on a semiconductor wafer having a pin pitch of 0.5 mm or smaller. The contact structure includes a micro contact pin having electric conductivity formed on one end of a beam which is movable in a vertical direction, and a piezoelectric element formed on the beam to drive the beam in the vertical direction. The beam is made of silicon on the surface of which is formed of a conductive thin film, and the micro contact pin has a pyramid shape. The piezoelectric element is a bimorph plate mounted on an upper surface of the beam or both upper and lower surfaces of the beam.

Method of producing micro contact structure and contact probe using same

A micro contact structure and a probe card to be used in testing performance of a semiconductor integrated circuit device formed on a semiconductor wafer have improved contact characteristics. The contact structure includes a micro contact pin having electric conductivity formed on one end of a beam which is movable in a vertical direction, and a piezoelectric element formed on the beam to drive the beam in the vertical direction. The beam is made of silicon on the surface of which is formed of a conductive thin film, and the micro contact pin has a pyramid shape. The piezoelectric element is a bimorph plate mounted on an upper surface of the beam or both upper and lower surfaces of the beam.

Growing community of inventors

Tokyo, Japan

Minako Yoshida