Growing community of inventors

Hsinchu, Taiwan

Min-Wei Hung

Average Co-Inventor Count = 4.90

ph-index = 2

The patent ph-index is calculated by counting the number of publications for which an author has been cited by other authors at least that same number of times.

Forward Citations = 9

Min-Wei HungKuo-Cheng Huang (7 patents)Min-Wei HungHsin-Yi Tsai (6 patents)Min-Wei HungYu-Hsuan Lin (2 patents)Min-Wei HungYi-Cheng Lin (2 patents)Min-Wei HungJer-Liang Andrew Yeh (2 patents)Min-Wei HungChao-Min Cheng (2 patents)Min-Wei HungDa-Jeng Yao (2 patents)Min-Wei HungLi-Wei Kuo (2 patents)Min-Wei HungHan-Chao Chang (2 patents)Min-Wei HungShih-Jie Lo (2 patents)Min-Wei HungChiou-Lian Lai (2 patents)Min-Wei HungHsin-Su Yu (2 patents)Min-Wei HungChung-Yao Hsu (2 patents)Min-Wei HungChao-Hung Cheng (2 patents)Min-Wei HungChi-Hung Huang (1 patent)Min-Wei HungChih-Yi Yang (1 patent)Min-Wei HungChun-Yao Huang (1 patent)Min-Wei HungYu-Cheng Su (1 patent)Min-Wei HungI-Lin Wu (1 patent)Min-Wei HungKeng-Liang Ou (1 patent)Min-Wei HungJiun-Woei Huang (1 patent)Min-Wei HungYu-Shan Su (1 patent)Min-Wei HungLing-Yu Tsai (1 patent)Min-Wei HungChing-Ching Yang (1 patent)Min-Wei HungJerliang Yeh (1 patent)Min-Wei HungYa-Cheng Liu (1 patent)Min-Wei HungHung-Che Chiang (1 patent)Min-Wei HungFang-Ci Su (1 patent)Min-Wei HungCheng-Ru Li (1 patent)Min-Wei HungChien-Kai Chung (1 patent)Min-Wei HungJyun-Yi Lai (1 patent)Min-Wei HungShih-Feng Tseng (1 patent)Min-Wei HungWen-Tse Hsiao (1 patent)Min-Wei HungMin-Wei Hung (12 patents)Kuo-Cheng HuangKuo-Cheng Huang (24 patents)Hsin-Yi TsaiHsin-Yi Tsai (29 patents)Yu-Hsuan LinYu-Hsuan Lin (85 patents)Yi-Cheng LinYi-Cheng Lin (46 patents)Jer-Liang Andrew YehJer-Liang Andrew Yeh (23 patents)Chao-Min ChengChao-Min Cheng (16 patents)Da-Jeng YaoDa-Jeng Yao (14 patents)Li-Wei KuoLi-Wei Kuo (7 patents)Han-Chao ChangHan-Chao Chang (3 patents)Shih-Jie LoShih-Jie Lo (2 patents)Chiou-Lian LaiChiou-Lian Lai (2 patents)Hsin-Su YuHsin-Su Yu (2 patents)Chung-Yao HsuChung-Yao Hsu (2 patents)Chao-Hung ChengChao-Hung Cheng (2 patents)Chi-Hung HuangChi-Hung Huang (22 patents)Chih-Yi YangChih-Yi Yang (21 patents)Chun-Yao HuangChun-Yao Huang (12 patents)Yu-Cheng SuYu-Cheng Su (10 patents)I-Lin WuI-Lin Wu (8 patents)Keng-Liang OuKeng-Liang Ou (8 patents)Jiun-Woei HuangJiun-Woei Huang (7 patents)Yu-Shan SuYu-Shan Su (5 patents)Ling-Yu TsaiLing-Yu Tsai (3 patents)Ching-Ching YangChing-Ching Yang (3 patents)Jerliang YehJerliang Yeh (1 patent)Ya-Cheng LiuYa-Cheng Liu (1 patent)Hung-Che ChiangHung-Che Chiang (1 patent)Fang-Ci SuFang-Ci Su (1 patent)Cheng-Ru LiCheng-Ru Li (1 patent)Chien-Kai ChungChien-Kai Chung (1 patent)Jyun-Yi LaiJyun-Yi Lai (1 patent)Shih-Feng TsengShih-Feng Tseng (1 patent)Wen-Tse HsiaoWen-Tse Hsiao (1 patent)
..
Inventor’s number of patents
..
Strength of working relationships

Company Filing History:

1. National Applied Research Laboratories (9 from 233 patents)

2. Tsinghua University (2 from 4,296 patents)

3. National Taiwan Normal University (1 from 131 patents)

4. Mfc Sealing Technology Co., Ltd. (1 from 3 patents)

5. Healthife Co., Ltd. (1 from 1 patent)


12 patents:

1. 10942456 - Device of light source with diode array emitting high-uniformity ultraviolet

2. 10928247 - System and method for detecting illuminance having a light sensor comprising a light emitting diode receiving a ray of light and generating a sensing voltage

3. 10912948 - Composite intelligent biological phototherapy device

4. 10180374 - Test device and method for testing contact lens and test device for testing hydrous element

5. 10086559 - System for online monitoring powder-based 3D printing processes and method thereof

6. 9689869 - Fluorescence excitation device and portable fluorescence analysis system with the same

7. 9600880 - Method and system for qualifying a surgical clip applier

8. 9348397 - Method of power management, portable system and portable power bank

9. 9255884 - Fluorescence strip, fluorescence excitation device and portable fluorescence analysis system with the same

10. 8956009 - Apparatus and methods for controlling a three-dimensional optical field

11. 8643836 - Inspection method for inspecting defects of wafer surface

12. 8643833 - System for inspecting surface defects of a specimen and a method thereof

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12/5/2025
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