Samsung Sds Co., Ltd.

Samsungsdsco.,ltd.

Min Sik Chu

Ji Hoon Kang

A Hyang Han

Seong Mi Park

Kyong Hee Joo

Jae Hoon Kim

Soon Mok Kwon

Baek Young Lee

Jiin Jeong

Ho Geun Park

Young Hyun Choi

Joo Yeon Chung

A method performed by a computing device for clustering an image according to an embodiment of the present disclosure includes performing a first clustering on feature vectors of the plurality of images, and performing a second clustering for feature vectors belonging to some clusters that do not satisfy a reference score among clusters formed as a result of the first clustering, wherein a clustering parameter of the second clustering and a clustering parameter of the first clustering are different from each other.

Method and apparatus for clustering images

Provided is a method of managing a target process. The method performed by a process management apparatus includes: generating a reference pattern indicating a normal state based on reference observed data on a process factor measured while the target process is maintained in the normal state; obtaining observed data on the process factor measured for a specified observation period; calculating a dissimilarity between the reference pattern and the observed data; and constructing a regression tree for the target process by using the observed data and the dissimilarity, wherein the process factor is set as an independent variable of the regression tree, and the dissimilarity is set as a dependent variable of the regression tree.

Process management method and apparatus

A method for clustering based on unsupervised learning according to an embodiment of the invention enables clustering for newly generated patterns and is robust against noise, and does not require tagging for training data. According to one or more embodiments, noise is accurately removed using three-dimensional stacked spatial auto-correlation, and multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values are used as learning features for clustering model generation, making them robust to noise, rotation, and fine unusual shapes. In addition, clusters resulting from clustering are classified into multi-level clusters, and stochastic automatic evaluation of normal/defect clusters is possible only with measurement data without a label.

Method and apparatus for detecting defect pattern on wafer based on unsupervised learning

A method for clustering based on unsupervised learning according to an embodiment of the invention enables clustering for newly generated patterns and is robust against noise, and does not require tagging for training data. According to one or more embodiments of the invention, noise is accurately removed using three-dimensional stacked spatial auto-correlation, and multivariate spatial probability distribution values and polar coordinate system spatial probability distribution values are used as learning features for clustering model generation, making them robust to noise, rotation, and fine unusual shapes. In addition, clusters resulting from clustering are classified into multi-level clusters, and stochastic automatic evaluation of normal/defect clusters is possible only with measurement data without a label.

A content scheduling method is provided. The content scheduling method, which is performed by a content scheduling apparatus, comprises acquiring a total play count of target content, determining a plurality of weight values of the target content with respect to a plurality of time slots, each weight value of the plurality of weight values indicating a first preference for the target content with respect to each time slot of the plurality of time slots, generating a linear programming model using the acquired total play count and the plurality of weight values and determining, via a processor, a play count of the target content in the each time slot of the plurality of time slots based on the linear programming model.

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Seoul, South Korea

Min Sik Chu