Industrial Technology Research Institute

Min-Kao Hong

Li-Huei Chen

Jen-Chao Lu

Shao-Wei Chung

Shang-Sian You

Hsin-Teng Lin

Po-Kuang Chang

Yu-Ying Huang

A method for compensating the axial ratio of an antenna for testing radio-frequency identification (RFID) tags and an apparatus using the method are provided. The method includes the following steps. An initial location of the RFID tag (or a tagged product) is set to obtain an initial vector. The RFID tag and the antenna are respectively rotated with a first axis and a second axis to detect characteristics of the RFID tag in all directions, and the first axis and the second axis are perpendicular. A polarization angle of the RFID tag is calculated according to the initial vector of the RFID tag and a location of the RFID tag after rotation. A compensation value is obtained through a look up table according to the polarization angle, so as to compensate for the axial ratio of the antenna.

Apparatus and method for compensating the axial ratio of an antenna for testing RFID tags

A system for testing RFID devices is introduced. The system includes a carrier plate configured for carrying an RFID device, a cable configured for supporting the carrier plate, a pulley apparatus configured for transporting the carrier plate along the cable, and a controller configured for adjusting test parameters in testing the RFID device.

System and method for testing RFID devices

Growing community of inventors

Taichung, Taiwan

Min-Kao Hong