Korea Electronics Technology Institute

Min-Hwan Song

Kwang-Ho Won

Il-Yeup Ahn

Jae-Ho Kim

Sang-Shin Lee

Sang-shin Lee

Tae-Hyun Kim

Jae-ho Kim

Tae-hyun Kim

Dong-Sun Kim

Yeon-Kug Moon

Jae-Seok Yoon

Min-Woo Ryu

A method for controlling a multi-sink/multi-path routing sensor network and a sensor network system using the same are provided. The method for controlling the sensor network includes generating, at a sensor node, sensing data; transmitting, at the sensor node, the sensing data to a plurality of sink nodes; and forwarding, at the sink nodes receiving the sensing data from the sensor node, the sensing data to a gateway. Hence, it is possible to satisfy the reliability required in the safety-critical system with the minimum traffic. Both of the two conflicting requirements which are the reliability enhancement of the sensor network and the minimization of the network traffic in the repeated data transmission, can be satisfied adequately.

Method for controlling multi-sink/multi-path routing sensor network and sensor network using the same

Provided is a beacon scheduling method based on a distributed address assignment scheme that schedules a beacon and minimizes data delay using non-collision of addresses in a network, such as a ZigBee network, that provides a distributed address system. In the method, a time offset Tbetween beacon reception from a parent device and beacon transmission of a device in a wireless network system having a tree structure may be obtained from T=SD&#xd7;(1+O&#xd7;B) according to an address of the device determined by a distributed address assignment mechanism to create a beacon transmission schedule, where SD denotes a super-frame duration, Odenotes a value for determining which child among sibling devices in the network the device corresponds to, and Bdenotes a maximum number of router devices that a sub-network having a depth d in a tree can have.

Collision-free beacon scheduling method based on distributed address assignment scheme

An fusing apparatus for correcting process variation is provided. The fusing apparatus for correcting the process variation of the semiconductor device includes a fusing part including a fusing resistor fused by a current penetrating; a current driving transistor for fusing the fusing resistor by driving a fusing current according to a fusing enable signal applied; a current path part for building a current path by connecting to the fusing part, and controlling a first node voltage according to a fusing state of the fusing resistor; and a latch part for latching a second node signal inversely amplified from the first node voltage, and outputting the latch value when a power-on reset part operates in a normal mode. Using the fusing cell, the test time can be reduced and the current consumption can be greatly decreased in the fusing process.

Fusing apparatus for correcting process variation

Provided is an apparatus and method for collaborative location awareness based on weighted maximum likelihood estimation (MLE), which is configured to improve accuracy of location awareness between nodes in estimating a location of a blind node. The method includes exchanging location awareness information with a reference node and a location-estimated blind node among peripheral nodes when location awareness is requested, performing location estimation based on weighted MLE, performing location calculation by using the location awareness information and an estimate obtained through the location estimation, and providing location awareness results of blind nodes.

Apparatus and method for collaborative location awareness based on weighted maximum likelihood estimation

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Seoul, South Korea

Min-Hwan Song