Freescale Semiconductor,inc.

Milind P Padhye

Christopher K Y Chun

Bhoodev Kumar

Yuan Yuan

Mahbub M Rashed

Christopher K Chun

Claude Moughanni

Andrew Paul Hoover

Brian M Millar

Darrell L Carder

Anuj Singhania

Bart J Martinec

Sanjay Gupta

Noah Bamford

A method of operating a circuit, including operating in a first mode, wherein in the first mode, a first power domain operates in an active power mode and a second power domain operates in an active power mode, wherein in the first mode, a first set of at least one terminal of a first circuit of the first power domain are coupled to a second set of at least one terminal of a second circuit of the second power mode via an isolation circuit for providing signals from the first circuit to the second circuit, is provided. The method further includes operating the circuit in a second mode, wherein in the second mode, the first power domain operates in a power gated mode and a second power domain operates in an active power mode.

Management of power domains in an integrated circuit

A technique of operating a processor subsystem masks interrupts to the processor subsystem during a power-down sequence of a processor of the processor subsystem. A boot vector for the processor of the processor subsystem is set. The boot vector provides an address associated with a saved processor state. A current state of the processor is saved to provide the saved processor state. The technique determines whether one or more first masked interrupts occurred during the saving of the current state of the processor. The processor that is to be powered-down is stopped when the one or more first masked interrupts did not occur during the saving of the current state of the processor. The technique also determines whether one or more second masked interrupts occurred following the saving of the current state of the processor. The processor is powered-down when the one or more second masked interrupts did not occur following the saving of the current state of the processor.

Techniques for operating a processor subsystem to service masked interrupts during a power-down sequence

A circuit comprises a first plurality of transistors of a first channel length disposed along a speedpath, the first plurality of transistors providing a first timing performance. The circuit also comprises a second plurality of transistors of a second channel length having an expected equivalent functionality as the first plurality of transistors and disposed in parallel with the first plurality of transistors along the speedpath, wherein the second channel length is different from the first channel length. In addition, the circuit comprises an element configured to selectively replace the first plurality of transistors with the second plurality of transistors in response to a determination that the first timing performance of the first plurality of transistors fails a timing requirement of the speedpath. In one embodiment, the second channel length is a sub-minimal geometry with respect to the first channel length.

Speedpath repair in an integrated circuit

Power consumption may be reduced through the use of power gating in which power is removed from circuit blocks or portions of circuit blocks in order to reduce leakage current. One embodiment uses a modified state retention flip-flop capable of retaining state when power is removed or partially removed from the circuit. Another embodiment uses a modified state retention buffer capable of retaining state when power is removed or partially removed from the circuit. The state retention flip-flop and buffer may be used to allow for state retention while still reducing leakage current. Also disclosed are various methods of reducing power and retaining state using, for example, the state retention flip-flops and buffers. For example, software, hardware, or a combination of software and hardware methods may be used to enter a deep sleep or idle mode while retaining state.

State retention within a data processing system

A circuit device having data retention latches utilizes a test interface and system test controller to control one or more components of the circuit device to ensure proper conditions for testing the data retention latches. The data retention latches each include a scan component that is part of a scan chain, a first latching component that is powered in a first voltage domain and a second latching component that is powered in a second voltage domain, where one of the voltage domains can be effectively shut down when the circuit device is placed in a low-voltage mode. The system test controller can control a scan controller used to scan test data in and out of the scan chain. The system test controller further can control a power controller used to manage a power down sequence and a power up sequence so as to ensure that the data retention latches are not placed in spurious states.

Testing of data retention latches in circuit devices

A flip-flop () comprises a first latch circuit (), a second latch circuit (), and a third latch circuit (). The first latch circuit () is coupled to receive a clock signal and a first power supply voltage. The second latch circuit () is coupled to the first latch circuit () and receives the clock signal and the first power supply voltage. Preparatory to entering a low power mode, the third latch circuit () receives a second power supply voltage and is coupled to the second latch circuit () in response to a power down signal. During the low power mode, the first power supply voltage is removed from the first and second latch circuits (). When returning to a normal operating mode, the first power supply voltage is provided to the first and second latch circuits (), and the third latch circuit () is coupled to the first latch circuit () in response to a power restore signal.

Flip-flop circuit having low power data retention

A flip-flop () has a normal mode and a low power mode to save power. The flip-flop () has a master latch () and a slave latch (). The slave latch () is used to retain the condition of the flip-flop () during the low power mode, where power is withdrawn from the master latch () but maintained on the slave latch (). The slave latch () may use transistors with lower leakage characteristics than the transistors that make up the master latch (). These lower leakage characteristics may be achieved by a higher threshold voltage and/or a thicker gate dielectric. Operating speed of the flip-flop () is maintained by implementing the slave latch () so that no logic gate or switching transistor is in the critical timing path. Instead, the slave latch () has an input/output terminal to tap into the signal path between the master latch and an output circuit ().

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Austin, TX, United States of America

Milind P Padhye