Micron Technology Incorporated

Qimonda Ag

Milena Ivanov

Martin Brox

Stefan Dietrich

Heinz Hoenigschmid

Michael Markert

Elena Cabrera Bernal

Manfred Hans Plan

Filippo Vitale

Oleg Sakolski

Methods, systems, and devices for temperature-dependent refresh operations are described. A memory system may adjust refresh operations based on a temperature of the memory system to reduce a refresh current and improve reliability of the refresh operations. For example, the memory system may include a temperature sensor configured to provide temperature information associated with a memory device. Based on the temperature information, the memory system may, in response to a refresh command, activate a set of access lines (e.g., word lines) to refresh memory cells coupled with the access lines, where a count of the set of access lines (e.g., how many access lines are included in the set) may be based on the temperature information. In some examples, the count of the set may be determined based on comparing the temperature information to one or more temperature thresholds.

Temperature-dependent refresh operations

The present invention relates to a method of performing a write access phase for a memory device and comprising:

Memory device with improved writing features

A method and apparatus for an integrated circuit with programmable memory cells which are arranged between a first and a second conductor for supplying first and second voltage is provided. A control circuit is arranged between the memory cells and the second conductor. The control circuit controls a change time during which at least one of the memory cells is supplied with a changing current from the second supply changing a state of the memory cell. The control circuit senses the state of the memory cell and stops the erasing current when the memory cell is in a changed state. Furthermore an embodiment refers to a data system with a programmable memory and a method of operating an integrated circuit. Another embodiment refers to a method of operating an integrated circuit.

Method and apparatus for an integrated circuit with programmable memory cells, data system

A memory chip with a plurality of FB DRAM cells, having a word line coupled to a first FB DRAM cell and a second FB DRAM cell is disclosed. The memory chip further has a first bit line coupled to the first FB DRAM cell, and a first state memory circuit coupled to the first bit line. The memory chip further includes a second bit line coupled to the second FB DRAM cell, and a second state memory circuit coupled to the second bit line. The memory chip further includes a sense amplifier, which can be coupled to the first FB DRAM cell, the second FB DRAM cell, the first state memory circuit or the second state memory circuit.

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Unterhaching, Germany

Milena Ivanov